Kitamura Miho, Souma Seigo, Honma Asuka, Wakabayashi Daisuke, Tanaka Hirokazu, Toyoshima Akio, Amemiya Kenta, Kawakami Tappei, Sugawara Katsuaki, Nakayama Kosuke, Yoshimatsu Kohei, Kumigashira Hiroshi, Sato Takafumi, Horiba Koji
Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), Tsukuba 305-0801, Japan.
Center for Spintronics Research Network, Tohoku University, Sendai 980-8577, Japan.
Rev Sci Instrum. 2022 Mar 1;93(3):033906. doi: 10.1063/5.0074393.
Angle-resolved photoemission spectroscopy using a micro-focused beam spot [micro-angle-resolved photoemission spectroscopy (ARPES)] is becoming a powerful tool to elucidate key electronic states of exotic quantum materials. We have developed a versatile micro-ARPES system based on the synchrotron radiation beam focused with a Kirkpatrick-Baez mirror optics. The mirrors are monolithically installed on a stage, which is driven with five-axis motion, and are vibrationally separated from the ARPES measurement system. Spatial mapping of the Au photolithography pattern on Si signifies the beam spot size of 10 µm (horizontal) × 12 µm (vertical) at the sample position, which is well suited to resolve the fine structure in local electronic states. Utilization of the micro-beam and the high precision sample motion system enables the accurate spatially resolved band-structure mapping, as demonstrated by the observation of a small band anomaly associated with tiny sample bending near the edge of a cleaved topological insulator single crystal.
使用微聚焦束斑的角分辨光电子能谱（微角分辨光电子能谱，即µARPES）正成为阐明奇异量子材料关键电子态的有力工具。我们基于用柯克帕特里克-贝兹镜光学聚焦的同步辐射束，开发了一种通用的微µARPES系统。这些镜子整体安装在一个由五轴运动驱动的平台上，并与µARPES测量系统在振动上分离。硅上金光刻图案的空间映射表明在样品位置处束斑尺寸为10 µm（水平）×12 µm（垂直），这非常适合解析局部电子态中的精细结构。如在劈开的拓扑绝缘体单晶边缘附近观察到与微小样品弯曲相关的小能带异常所表明的那样，微束和高精度样品运动系统的使用能够实现精确的空间分辨能带结构映射。
