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碲化镓多层膜中的异常变形与断裂

Unusual Deformation and Fracture in Gallium Telluride Multilayers.

作者信息

Zhou Yan, Zhou Shi, Ying Penghua, Zhao Qinghua, Xie Yong, Gong Mingming, Jiang Pisu, Cai Hui, Chen Bin, Tongay Sefaattin, Zhang Jin, Jie Wanqi, Wang Tao, Tan Pingheng, Liu Dong, Kuball Martin

机构信息

State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.

Center for Device Thermography and Reliability (CDTR), H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol BS8 1TL, U.K.

出版信息

J Phys Chem Lett. 2022 May 5;13(17):3831-3839. doi: 10.1021/acs.jpclett.2c00411. Epub 2022 Apr 25.

Abstract

The deformation and fracture mechanism of two-dimensional (2D) materials are still unclear and not thoroughly investigated. Given this, mechanical properties and mechanisms are explored on example of gallium telluride (GaTe), a promising 2D semiconductor with an ultrahigh photoresponsivity and a high flexibility. Hereby, the mechanical properties of both substrate-supported and suspended GaTe multilayers were investigated through Berkovich-tip nanoindentation instead of the commonly used AFM-based nanoindentation method. An unusual concurrence of multiple pop-in and load-drop events in loading curve was observed. Theoretical calculations unveiled this concurrence originating from the interlayer-sliding mediated layers-by-layers fracture mechanism in GaTe multilayers. The van der Waals force dominated interlayer interactions between GaTe and substrates was revealed much stronger than that between GaTe interlayers, resulting in the easy sliding and fracture of multilayers within GaTe. This work introduces new insights into the deformation and fracture of GaTe and other 2D materials in flexible electronics applications.

摘要

二维(2D)材料的变形和断裂机制仍不明确,尚未得到充分研究。鉴于此,以碲化镓(GaTe)为例探索其力学性能和机制,GaTe是一种很有前景的二维半导体,具有超高的光响应性和高柔韧性。在此,通过Berkovich尖端纳米压痕而非常用的基于原子力显微镜(AFM)的纳米压痕方法,研究了衬底支撑和悬空的GaTe多层膜的力学性能。在加载曲线中观察到多个压入和载荷下降事件的异常同时出现。理论计算揭示,这种同时出现源于GaTe多层膜中层间滑动介导的逐层断裂机制。结果表明,GaTe与衬底之间由范德华力主导的层间相互作用比GaTe层间的相互作用强得多,导致GaTe多层膜内部易于滑动和断裂。这项工作为GaTe和其他二维材料在柔性电子应用中的变形和断裂引入了新的见解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/306b/9082608/8d9032a24e54/jz2c00411_0001.jpg

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