How Ying Ying, Morgan Kaye S
Opt Express. 2022 Mar 28;30(7):10899-10918. doi: 10.1364/OE.451834.
X-ray dark-field imaging reveals the sample microstructure that is unresolved when using conventional methods of x-ray imaging. In this paper, we derive a new method to extract and quantify the x-ray dark-field signal collected using a single-grid imaging set-up, and relate the signal strength to the number of sample microstructures, N. This was achieved by modelling sample-induced changes to the shadow of the upstream grid, and fitting experimental data to this model. Our results suggested that the dark-field scattering angle from our spherical microstructures deviates slightly from the theoretical model of , which was consistent with results from other experimental methods. We believe the approach outlined here can equip quantitative dark-field imaging of small samples, particularly in cases where only one sample exposure is possible, either due to sample movement or radiation dose limitations. Future directions include an extension into directional dark-field imaging.
X射线暗场成像揭示了使用传统X射线成像方法时无法分辨的样品微观结构。在本文中，我们推导了一种新方法，用于提取和量化使用单网格成像装置收集的X射线暗场信号，并将信号强度与样品微观结构的数量N相关联。这是通过对样品引起的上游网格阴影变化进行建模，并将实验数据拟合到该模型来实现的。我们的结果表明，我们的球形微观结构的暗场散射角与理论模型略有偏差，这与其他实验方法的结果一致。我们相信，这里概述的方法可以用于小样品的定量暗场成像，特别是在由于样品移动或辐射剂量限制而只能进行一次样品曝光的情况下。未来的方向包括扩展到定向暗场成像。
