Iwai A, Sakamoto T, Kinoshita Y, Yokota J, Yoshioka T, Sugimoto T
Neuroradiology. 1987;29(4):398-400. doi: 10.1007/BF00348923.
A case of severe hypoglycemic coma was studied by sequential Computed Tomographic Imaging (CT) of the brain. The CT 1) was normal in the early stage, 2) subsequently showed a low density area, which was enhanced by the contrast medium, in the cerebral cortex and the boundary zone between the major cerebral arteries, and 3) revealed marked enhancement in the entire cortical region and hypodensity in the periventricular region in the late stage. These CT findings, representing the course of neural cell damage by severe hypoglycemia, are discussed from the pathophysiological viewpoint.
通过对脑部进行连续计算机断层扫描成像(CT)研究了一例严重低血糖昏迷病例。CT表现为:1)早期正常;2)随后在大脑皮质及大脑主要动脉之间的边界区出现低密度区,该区域经造影剂增强;3)后期显示整个皮质区域明显强化,脑室周围区域低密度。从病理生理学角度讨论了这些代表严重低血糖所致神经细胞损伤过程的CT表现。