Jagani Hirenkumar Shantilal, Dixit Vijay, Patel Abhishek, Gohil Jagrutiba, Pathak V M
Department of Physics, Sardar Patel University, Vallabh Vidyanagar 388 120 Gujarat India
Department of Physics, A. N. Patel Post Graduate Institute of Science and Research Anand 388001 India.
RSC Adv. 2022 Oct 10;12(44):28693-28706. doi: 10.1039/d2ra05492b. eCollection 2022 Oct 4.
In the present investigation Sn Sb Se crystals are grown using the direct vapor transport method. The crystals after growth were analyzed by EDAX and XPS to confirm the elemental composition. The surface morphological properties were studied by scanning electron microscope, confirming a flat surface and layered growth of the Sn Sb Se crystals. The structural properties studied by X-ray diffraction and high-resolution transmission electron microscopy confirm the orthorhombic structure of the grown Sn Sb Se crystals. The Raman spectroscopic measurements evince the presence of B2g and Ag vibration modes. The PL intensity peak at ∼400 nm to 500 nm confirms the energy band gap. The indirect energy band gap of 1.18 eV was evaluated using Tauc plot by employing UV-visible spectroscopy making it a promising candidate for optoelectronic and photonic applications. The pulse photo response of pure and doped samples was studied under a monochromatic source of wavelength 670 nm and intensity of 30 mW cm at zero biasing voltage firstly on day one and then the same samples were preserved for 50 days and the stability of the photodetectors was observed. Photodetector parameters such as rise time, decay time, photocurrent, responsivity, sensitivity, and detectivity were observed, and evaluated results are presented in this article.
在本研究中,采用直接气相输运法生长了Sn Sb Se晶体。生长后的晶体通过能谱仪(EDAX)和X射线光电子能谱(XPS)进行分析,以确认其元素组成。通过扫描电子显微镜研究了表面形态特性,证实了Sn Sb Se晶体的表面平整且呈层状生长。通过X射线衍射和高分辨率透射电子显微镜研究的结构特性证实了生长的Sn Sb Se晶体为正交结构。拉曼光谱测量表明存在B2g和Ag振动模式。在约400 nm至500 nm处的光致发光强度峰证实了能带隙。通过紫外可见光谱利用Tauc图评估出间接能带隙为1.18 eV,这使其成为光电子和光子应用的有前途的候选材料。首先在第一天,在零偏置电压下,在波长670 nm、强度为30 mW/cm²的单色光源下研究了纯样品和掺杂样品的脉冲光响应,然后将相同的样品保存50天,观察光电探测器的稳定性。观察了诸如上升时间、衰减时间、光电流、响应度、灵敏度和探测率等光电探测器参数,并在本文中给出了评估结果。