Yu Zhipeng, Zhao Xiaofeng, Ai Chunpeng, Fang Xin, Zhao Xiaohan, Wang Yanchao, Zhang Hongquan
Heilongjiang Provincial Key Laboratory of Micro-Nano Sensitive Devices and Systems, Heilongjiang University, Harbin 150080, China.
Micromachines (Basel). 2022 Dec 29;14(1):93. doi: 10.3390/mi14010093.
Write-once-read-many-times (WORM) memory belonging to an important non-volatile memory type achieves the read-only state after the write operation and is used in the fields of data security storage widely. WORM memory has been developed based on a variety of materials. In recent years, halide perovskites have become the research hotspot material for this memory due to its excellent properties. Here, the all-inorganic CsPbBr perovskite thin film was prepared on a FTO substrate by using a two-step method. The prepared CsPbBr thin films have the characteristics of densely packed crystal grains and smooth surface. The device, having the FTO/CsPbBr/Al sandwich structure by evaporating the Al electrode onto the CsPbBr thin film, represents the typical WORM behavior, with long data retention time (10 s), a low operation voltage (2.1 V) and a low reading voltage (0.1 V). Additionally, the resistance transition mechanism of the resulting WORM devices was analyzed.
一次写入多次读取(WORM)存储器属于重要的非易失性存储器类型,在写入操作后实现只读状态,并广泛应用于数据安全存储领域。WORM存储器已基于多种材料开发。近年来,卤化物钙钛矿因其优异的性能而成为这种存储器的研究热点材料。在此,采用两步法在FTO衬底上制备了全无机CsPbBr钙钛矿薄膜。所制备的CsPbBr薄膜具有晶粒密集堆积和表面光滑的特点。通过在CsPbBr薄膜上蒸发Al电极形成FTO/CsPbBr/Al三明治结构的器件表现出典型的WORM行为,具有长数据保持时间(10秒)、低工作电压(2.1V)和低读取电压(0.1V)。此外,还分析了所得WORM器件的电阻转变机制。