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β-(AlGa)O 薄膜中的 Al 协调和 Ga 间隙稳定。

Al Coordination and Ga Interstitial Stability in a β-(AlGa)O Thin Film.

机构信息

Department of Materials Science and Engineering, Materials Research Institute, The Pennsylvania State University, University Park, Texas 16802-1503, United States.

Materials Science and Engineering, Columbus, Ohio 43210-1132, United States.

出版信息

ACS Appl Mater Interfaces. 2023 Feb 15;15(6):8601-8608. doi: 10.1021/acsami.2c17934. Epub 2023 Feb 1.

DOI:10.1021/acsami.2c17934
PMID:36724080
Abstract

Alloying AlO with GaO to form β-(AlGa)O opens the door to a large number of new possibilities for the fabrication of devices with tunable properties in many high-performance applications such as optoelectronics, sensing systems, and high-power electronics. Often, the properties of these devices are impacted by defects induced during the growth process. In this work, we uncover the crystal structure of a β-(AlGa)O/β-GaO interface grown by molecular beam epitaxy. In particular, we determine Al coordination and the stability of Al and Ga interstitials and their effect on the electronic structure of the material by means of scanning transmission electron microscopy combined with density functional theory. Al atoms can substitutionally occupy both octahedral and tetrahedral sites. The atomic structure of the β-(AlGa)O/β-GaO interface additionally shows Al and Ga interstitials located between neighboring tetrahedrally coordinated cation sites, whose stability will depend on the number of surrounding Al atoms. The presence of Al atoms near interstitials leads to structural distortions in the lattice and creates interstitial-divacancy complexes that will eventually form deep-level states below the conduction band () at -1.25 eV, -1.68 eV, -1.78 eV, -1.83 eV, and -1.86 eV for a Ga interstitial surrounded by zero, one, two, three, and four Al atoms, respectively. These findings bring new insight toward the fabrication of tunable β-(AlGa)O heterostructure-based devices with controlled electronic properties.

摘要

将 AlO 与 GaO 合金化形成 β-(AlGa)O,为许多高性能应用(如光电、传感系统和高功率电子)中具有可调特性的器件的制造开辟了大量新的可能性。通常,这些器件的性能会受到生长过程中产生的缺陷的影响。在这项工作中,我们揭示了通过分子束外延生长的 β-(AlGa)O/β-GaO 界面的晶体结构。具体来说,我们通过扫描透射电子显微镜结合密度泛函理论确定了 Al 配位和 Al 与 Ga 间隙原子的稳定性,以及它们对材料电子结构的影响。Al 原子可以取代地占据八面体和四面体位置。β-(AlGa)O/β-GaO 界面的原子结构还显示出位于相邻四面体配位阳离子位置之间的 Al 和 Ga 间隙原子,其稳定性将取决于周围 Al 原子的数量。间隙原子附近存在 Al 原子会导致晶格结构发生畸变,并形成间隙-空位复合物,最终在导带()以下形成深能级,对于被零、一、二、三、四个 Al 原子包围的 Ga 间隙原子,其位置分别为-1.25 eV、-1.68 eV、-1.78 eV、-1.83 eV 和-1.86 eV。这些发现为制造具有可控电子特性的可调谐β-(AlGa)O 异质结构器件提供了新的见解。

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