Molecular Beam Epitaxy of β-(InGa)O on β-GaO (010): Compositional Control, Layer Quality, Anisotropic Strain Relaxation, and Prospects for Two-Dimensional Electron Gas Confinement.

In this work, we investigate the growth of monoclinic β-(InGa)O alloys on top of (010) β-GaO substrates via plasma-assisted molecular beam epitaxy. In particular, using different (reflection high-energy electron diffraction) and (atomic force microscopy, X-ray diffraction, time-of-flight secondary ion mass spectrometry, and transmission electron microscopy) characterization techniques, we discuss (i) the growth parameters that allow for In incorporation and (ii) the obtainable structural quality of the deposited layers as a function of the alloy composition. In particular, we give experimental evidence of the possibility of coherently growing (010) β-(InGa)O layers on β-GaO with good structural quality for up to ≈ 0.1. Moreover, we show that the monoclinic structure of the underlying (010) β-GaO substrate can be preserved in the β-(InGa)O layers for wider concentrations of In ( ≤ 0.19). Nonetheless, the formation of a large amount of structural defects, like unexpected () oriented twin domains and partial segregation of In is suggested for > 0.1. Strain relaxes anisotropically, maintaining an elastically strained unit cell along the * direction vs plastic relaxation along the * direction. This study provides important guidelines for the low-end side tunability of the energy bandgap of β-GaO-based alloys and provides an estimate of its potential in increasing the confined carrier concentration of two-dimensional electron gases in β-(InGa)O/(AlGa)O heterostructures.