Graduated School of Science and Engineering, Saitama University, 255 Shimo-Okubo, Sakura-ku, Saitama 338-8570, Japan.
Rev Sci Instrum. 2023 Jan 1;94(1):014902. doi: 10.1063/5.0124602.
This paper introduces transient Harman (TH), impedance spectroscopy (IS), and time-domain impedance spectroscopy (TDIS) methods as feasible techniques for determining the temperature dependence shown by the dimensionless figure of merit (zT) of a BiTe-based thermoelectric module from 50 to 320 K. An optimum current was selected to deduce the proper zT under a dominant Peltier heat. The comparison results indicated that the TH method enables a rapid estimation of zT, typically within several minutes. Although the measurement times for the IS (several minutes to hours) and TDIS (several minutes) methods were different, both the methods yielded comparable zT values, and the TDIS method was found to be more reliable for the module with zT > 0.02 and a resolution of 0.001. Furthermore, temperature stabilization of the measurement specimen using the TDIS method also emerged as one of the key factors that determined the accuracy and resolution of the zT estimation.
本文介绍了瞬态哈曼（TH）、阻抗谱（IS）和时域阻抗谱（TDIS）方法，这些方法可用于确定从 50 到 320K 范围内基于 BiTe 的热电模块无量纲优值（zT）的温度依赖性。选择最佳电流以在主导的珀尔帖热下推导出合适的 zT。比较结果表明，TH 方法能够快速估计 zT，通常在几分钟内完成。尽管 IS（几分钟到几小时）和 TDIS（几分钟）方法的测量时间不同，但两种方法都得到了可比的 zT 值，并且发现 TDIS 方法对于 zT > 0.02 且分辨率为 0.001 的模块更可靠。此外，使用 TDIS 方法对测量样品进行温度稳定也成为确定 zT 估计准确性和分辨率的关键因素之一。
