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在300K温度下利用热泄漏通过时域阻抗谱测量热电模块特性。

Measuring thermoelectric module properties by time-domain impedance spectroscopy using heat leakage at 300 K.

作者信息

Kodama Kotoko, Hasegawa Yasuhiro

机构信息

Graduate School of Science and Engineering, Saitama University, 255, Shimo-Okubo, Sakura, Saitama, 338-8570, Japan.

出版信息

Sci Rep. 2025 Mar 22;15(1):9989. doi: 10.1038/s41598-025-94235-3.

DOI:10.1038/s41598-025-94235-3
PMID:40121359
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11929928/
Abstract

All key thermoelectric properties of thermoelectric materials (i.e., resistivity ρ, dimensionless figure of merit zT, thermal conductivity κ, and Seebeck coefficient S) were measured at 300 K using time-domain impedance spectroscopy (TDIS). This method accounted for heat leakage through lead wires connected to a bismuth-telluride-based Π-shaped thermoelectric module. The values of ρ and zT, without considering heat leakage, were rapidly determined in the frequency domain using impedance measurements with alternating current and in the time domain through transient-response measurements with direct current. The thermal conductance ratio K/K, which represents the relationship between the thermal conductance of the thermoelectric material K and that of the lead wires causing heat leakage K, was also evaluated. The effective dimensionless figure of merit zT was estimated at various K/K ratios to assess the influence of heat leakage. At 300 K, the estimated thermoelectric parameters were ρ = 10.19 μΩm, zT = 0.8645 ± 0.0003, κ = 1.259 ± 0.003 W/mK, and |S| = 192.3 ± 0.4 μV/K. The results indicate that for accurate determination of all thermoelectric parameters using TDIS, the condition K/K > 0.1 is required when performing K/K-dependent experiments on the modules with zT = 0.8645.

摘要

热电材料的所有关键热电性能(即电阻率ρ、无量纲优值zT、热导率κ和塞贝克系数S)均在300 K下使用时域阻抗谱(TDIS)进行测量。该方法考虑了通过连接到基于碲化铋的Π形热电模块的引线的热泄漏。在不考虑热泄漏的情况下,ρ和zT的值通过使用交流电的阻抗测量在频域中快速确定,并通过使用直流电的瞬态响应测量在时域中确定。还评估了表示热电材料的热导率K与导致热泄漏的引线的热导率K之间关系的热导比K/K。在各种K/K比下估计有效无量纲优值zT,以评估热泄漏的影响。在300 K时,估计的热电参数为ρ = 10.19 μΩm,zT = 0.8645 ± 0.0003,κ = 1.259 ± 0.003 W/mK,以及|S| = 192.3 ± 0.4 μV/K。结果表明,对于使用TDIS准确测定所有热电参数,在对zT = 0.8645的模块进行依赖于K/K的实验时,需要K/K > 0.1的条件。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/b48d8bb4aba6/41598_2025_94235_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/25de846795df/41598_2025_94235_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/38d3304b0f72/41598_2025_94235_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/0702db45fa9d/41598_2025_94235_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/3d81b47ff1d3/41598_2025_94235_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/1c6bafbef477/41598_2025_94235_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/288130fa9a17/41598_2025_94235_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/b48d8bb4aba6/41598_2025_94235_Fig7_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/25de846795df/41598_2025_94235_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/38d3304b0f72/41598_2025_94235_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/0702db45fa9d/41598_2025_94235_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/3d81b47ff1d3/41598_2025_94235_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/1c6bafbef477/41598_2025_94235_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/288130fa9a17/41598_2025_94235_Fig6_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a7f0/11929928/b48d8bb4aba6/41598_2025_94235_Fig7_HTML.jpg

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