Design and Simulation of a Ratiometric SPR Sensor Based on a 2D van der Waals Heterojunction for Refractive Index Measurement.

Surface plasmon resonance (SPR) sensors have been widely applied in many fields because of their advantages of working in real time and high sensitivity. However, because the spectrum of an SPR sensor is easily affected by the smoothness of the metal surface, this type of sensor has obvious disadvantages in the application of quantitative detection. We designed an SPR refractive index sensor for molecular detection that has the advantage of quantifiability. A ratio spectral quantitative analysis method was established based on the two coherent dips of the SPR spectrum formed by the strong coupling effect between the surface plasmon polaritons and the excitons of the J-aggregate molecule 5,6-dichloro-2-[3-[5,6-dichloro-1-ethyl-3-(4-sulfobutyl)-2-benzimidazoline subunit] propenyl]-3-ethyl-1-(4-sulfobutyl) benzimidazole hydroxide inner salt (TDBC). The introduced MoS/graphene van der Waals heterojunction produced an effective charge transfer to the Ag film, resulting in significant electric field enhancement at the sensing interface and further improving the detection sensitivity of the sensor. The simulation results showed that for 43 nm Ag film, for example, the ratiometric SPR sensor with the Ag film structure can obtain 16.12 RIU sensing sensitivity, applied to the detection of gas molecules, while the SPR sensor with single-layer graphene and three layers of MoS heterostructures can obtain 50.68 RIU sensing sensitivity. The addition of van der Waals heterostructures can significantly improve sensing performance by 215%.