Zou Junjun, Wei Qi, Ju Chunge, Liao Hua, Gu Haoyu, Xing Bowen, Zhou Bin, Zhang Rong
Department of Precision Instruments, Tsinghua University, Beijing, 100084 China.
Microsyst Nanoeng. 2023 Apr 17;9:48. doi: 10.1038/s41378-023-00505-3. eCollection 2023.
High-precision microelectromechanical system (MEMS) gyroscopes are significant in many applications. Bias instability (BI) is an important parameter that indicates the performance of a MEMS gyroscope and is affected by the 1/ noise of the MEMS resonator and readout circuit. Since the bandgap reference (BGR) is an important block in the readout circuit, reducing its 1/ noise is key to improving a gyroscope's BI. In a traditional BGR, the error amplifier is applied to provide a virtual short-circuit point, but it introduces the main low-frequency noise sources. This paper proposes an ultralow 1/ noise BGR by removing the error amplifier and applying an optimized circuit topology. In addition, a simplified but accurate noise model of the proposed BGR is obtained to optimize the BGR's output noise performance. To verify this design, the proposed BGR has been implemented in a 180 nm CMOS process with a chip area of 545 × 423 μm. The experimental results show that the BGR's output integrated noise from 0.1 to 10 Hz is 0.82 μV and the thermal noise is 35 nV/√Hz. Furthermore, bias stability tests of the MEMS gyroscope fabricated in our laboratory with the proposed BGR and some commercial BGRs are carried out. Statistical results show that reducing the BGR's 1/f noise can nearly linearly improve the gyroscope's BI.
高精度微机电系统(MEMS)陀螺仪在许多应用中都具有重要意义。偏置不稳定性(BI)是表明MEMS陀螺仪性能的一个重要参数,并且受MEMS谐振器和读出电路的1/f噪声影响。由于带隙基准(BGR)是读出电路中的一个重要模块,降低其1/f噪声是提高陀螺仪BI的关键。在传统的BGR中,应用误差放大器来提供一个虚拟短路点,但它引入了主要的低频噪声源。本文提出一种通过去除误差放大器并应用优化电路拓扑的超低1/f噪声BGR。此外,获得了所提出BGR的一个简化但准确的噪声模型,以优化BGR的输出噪声性能。为验证该设计,所提出的BGR已采用180nm CMOS工艺实现,芯片面积为545×423μm。实验结果表明,该BGR在0.1至10Hz的输出积分噪声为0.82μV,热噪声为35nV/√Hz。此外,对在我们实验室采用所提出的BGR和一些商用BGR制造的MEMS陀螺仪进行了偏置稳定性测试。统计结果表明,降低BGR的1/f噪声可近乎线性地提高陀螺仪的BI。