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任意子统计揭示的分数激发的 Hong-Ou-Mandel 干涉。

Anyonic Statistics Revealed by the Hong-Ou-Mandel Dip for Fractional Excitations.

机构信息

Aix Marseille Univ, Université de Toulon, CNRS, CPT, Marseille, France.

出版信息

Phys Rev Lett. 2023 May 5;130(18):186203. doi: 10.1103/PhysRevLett.130.186203.

Abstract

The fractional quantum Hall effect (FQHE) is known to host anyons, quasiparticles whose statistics is intermediate between bosonic and fermionic. We show here that Hong-Ou-Mandel (HOM) interferences between excitations created by narrow voltage pulses on the edge states of a FQHE system at low temperature show a direct signature of anyonic statistics. The width of the HOM dip is universally fixed by the thermal time scale, independently of the intrinsic width of the excited fractional wave packets. This universal width can be related to the anyonic braiding of the incoming excitations with thermal fluctuations created at the quantum point contact. We show that this effect could be realistically observed with periodic trains of narrow voltage pulses using current experimental techniques.

摘要

分数量子霍尔效应 (FQHE) 中存在任意子,即一种处于玻色子和费米子之间的准粒子。我们在这里表明,低温下 FQHE 系统边缘态上窄电压脉冲产生的激发之间的 Hong-Ou-Mandel(HOM)干涉,直接显示出任意子统计的特征。HOM 凹陷的宽度普遍由热时间尺度固定,与激发的分数波包的固有宽度无关。这个普遍的宽度可以与进入的激发与量子点接触处的热涨落之间的任意子交织联系起来。我们表明,使用当前的实验技术,通过周期性的窄电压脉冲序列可以实际观测到这种效应。

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