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小麦低重组区域基因的物理图谱构建:C 基因座的辐射杂种作图。

Physical mapping of the wheat genes in low-recombination regions: radiation hybrid mapping of the C-locus.

机构信息

Department of Plant Sciences and Landscape Architecture, University of Maryland College Park, College Park, USA.

Punjab Agricultural University, Ludhiana, India.

出版信息

Theor Appl Genet. 2023 Jun 21;136(7):159. doi: 10.1007/s00122-023-04403-0.

DOI:10.1007/s00122-023-04403-0
PMID:37344686
Abstract

This work reports the physical mapping of an important gene affecting spike compactness located in a low-recombination region of hexaploid wheat. This work paves the way for the eventual isolation and characterization of the factor involved but also opens up possibilities to use this approach to precisely map other wheat genes located on proximal parts of wheat chromosomes that show highly reduced recombination. Mapping wheat genes, in the centromeric and pericentromeric regions (~ 2/3rd of a given chromosome), poses a formidable challenge due to highly suppressed recombination. Using an example of compact spike locus (C-locus), this study provides an approach to precisely map wheat genes in the pericentromeric and centromeric regions that house ~ 30% of wheat genes. In club-wheat, spike compactness is controlled by the dominant C-locus, but previous efforts have failed to localize it, on a particular arm of chromosome 2D. We integrated radiation hybrid (RH) and high-resolution genetic mapping to locate C-locus on the short arm of chromosome 2D. Flanking markers of the C-locus span a physical distance of 11.0 Mb (231.0-242 Mb interval) and contain only 11 high-confidence annotated genes. This work demonstrates the value of this integrated strategy in mapping dominant genes in the low-recombination regions of the wheat genome. A comparison of the mapping resolutions of the RH and genetic maps using common anchored markers indicated that the RH map provides ~ 9 times better resolution that the genetic map even with much smaller population size. This study provides a broadly applicable approach to fine map wheat genes in regions of suppressed recombination.

摘要

这项工作报道了一个影响穗部紧凑度的重要基因在六倍体小麦低重组区域的物理图谱。这项工作为最终分离和鉴定相关因子铺平了道路,同时也为利用这种方法精确地定位位于小麦染色体近端部分、重组率极低的其他小麦基因提供了可能。由于重组高度抑制,在着丝粒和着丝粒周围区域(约给定染色体的 2/3)定位小麦基因极具挑战性。本研究以紧凑穗部基因座(C 基因座)为例,提供了一种在着丝粒周围和着丝粒区域精确定位小麦基因的方法,该区域约包含 30%的小麦基因。在节节麦中,穗部紧凑性由显性 C 基因座控制,但以前的研究未能将其定位在染色体 2D 的特定臂上。我们整合了辐射杂种(RH)和高分辨率遗传图谱,将 C 基因座定位在染色体 2D 的短臂上。C 基因座的侧翼标记跨越 11.0Mb 的物理距离(231.0-242Mb 区间),仅包含 11 个高可信度注释基因。这项工作证明了这种整合策略在定位小麦基因组低重组区域的显性基因方面的价值。利用共同锚定标记比较 RH 图谱和遗传图谱的作图分辨率表明,即使 RH 图谱的群体规模小得多,RH 图谱提供的分辨率也比遗传图谱高约 9 倍。这项研究为在重组抑制区域精细定位小麦基因提供了一种广泛适用的方法。

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