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基底膜阻抗中是否需要活性元素?

Are active elements necessary in the basilar membrane impedance?

作者信息

Diependaal R J, Viergever M A, de Boer E

出版信息

J Acoust Soc Am. 1986 Jul;80(1):124-32. doi: 10.1121/1.394460.

Abstract

This article is motivated by the current hypothesis [Kim et al., Psychological, Physiological and Behavioural Studies in Hearing (Delft U. P., The Netherlands, 1980); Neely, Doctoral dissertation, Washington University, St. Louis, MO (1981); de Boer, J. Acoust. Soc. Am. 73, 567-573 (1983a) and 73, 574-576 (1983b)] that it is necessary to include active elements in the basilar membrane (BM) impedance in order to explain recent data on the vibration of the BM [Khanna and Leonard, Science 215, 305-306 (1982); Sellick et al., J. Acoust. Soc. Am. 72, 131-141 (1982); Robles et al., Peripheral Auditory Mechanisms (Springer, New York, 1986)]. In order to test this hypothesis, first, a method which is an inversion of the customary description of cochlear mechanics is described. Instead of computing the BM velocity for a given point impedance of the membrane, we show how to compute the impedance function from a given BM velocity pattern in response to a sinusoidal input at the stapes. This method is then used to study the sensitivity of the recovered impedance to perturbations in the velocity pattern. The simulations used show that the real part of the impedance is extremely sensitive to such perturbations. Therefore, measured velocity patterns are unlikely to resolve the issue of whether active elements should be included. Frequency responses measured at a few points on the membrane are even less likely to do so.

摘要

本文的灵感来源于当前的假说[金等人,《听力的心理、生理和行为研究》(荷兰代尔夫特大学出版社,1980年);尼利,博士论文,华盛顿大学,密苏里州圣路易斯(1981年);德布尔,《美国声学学会杂志》73, 567 - 573(1983a)和73, 574 - 576(1983b)],即有必要在基底膜(BM)阻抗中纳入有源元件,以便解释最近关于BM振动的数据[坎纳和伦纳德,《科学》215, 305 - 306(1982年);塞利克等人,《美国声学学会杂志》72, 131 - 141(1982年);罗布尔斯等人,《外周听觉机制》(施普林格出版社,纽约,1986年)]。为了检验这一假说,首先描述了一种与耳蜗力学传统描述相反的方法。我们不是针对膜的给定的点阻抗计算BM速度,而是展示如何根据在镫骨处以正弦输入时给定的BM速度模式来计算阻抗函数。然后使用该方法来研究恢复的阻抗对速度模式扰动的敏感性。所使用的模拟表明,阻抗的实部对这种扰动极其敏感。因此,测量的速度模式不太可能解决是否应纳入有源元件这一问题。在膜上几个点测量的频率响应更不可能做到这一点。

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