Kim Kyunghwan, Choi Sunhae, Bong Haekyun, Lee Hanglim, Kim Minyoung, Oh Jungwoo
School of Integrated Technology, Yonsei University, 85, Songdogwahak-ro, Yeonsu-gu, Incheon, 21983, Republic of Korea.
SEMES, 1339, Hyohaeng-ro, Hwaseong-Si, Gyeonggi-do, 18383, Republic of Korea.
Nanoscale. 2023 Aug 25;15(33):13685-13691. doi: 10.1039/d3nr02053c.
Metal-assisted chemical etching (MACE) has received much attention from researchers because it can be used to fabricate plasma-free anisotropic etching profiles for semiconductors. However, the etching mechanism of MACE is based on the catalytic reaction of noble metals, which restricts its use in complementary metal oxide semiconductor (CMOS) processes. To obtain process compatibility, we developed catalytic Ni after alloying it with Si as a substitute for noble metals in the MACE of Si substrates. Nickel silicide is a material commonly used as a contact electrode in CMOS processes. When NiSi was used as the catalyst, the anisotropic etching of Si with a smooth surface was successfully demonstrated. Silicidation increased the standard reduction potential of the Ni alloy and enhanced the electrochemical stability in the MACE of Si. In contrast, when pure Ni was used as the catalyst, a rough-etched surface was fabricated because of the low standard reduction potential. Based on the experimental results, the factors affecting the MACE of Si were systematically analyzed to optimize the catalytic NiSi properties. The implementation of the NiSi alloy potentially eliminates the use of noble metals in MACE and allows the technology to be adopted in contemporary CMOS processes.
金属辅助化学蚀刻(MACE)已受到研究人员的广泛关注,因为它可用于制造用于半导体的无等离子体各向异性蚀刻轮廓。然而,MACE的蚀刻机制基于贵金属的催化反应,这限制了其在互补金属氧化物半导体(CMOS)工艺中的应用。为了获得工艺兼容性,我们在将镍与硅合金化后开发了催化镍,以替代硅衬底MACE中的贵金属。硅化镍是一种在CMOS工艺中常用作接触电极的材料。当使用NiSi作为催化剂时,成功证明了具有光滑表面的硅的各向异性蚀刻。硅化提高了镍合金的标准还原电位,并增强了硅MACE中的电化学稳定性。相比之下,当使用纯镍作为催化剂时,由于标准还原电位低,会制造出粗糙蚀刻的表面。基于实验结果,系统分析了影响硅MACE的因素,以优化催化NiSi的性能。NiSi合金的应用有可能消除MACE中贵金属的使用,并使该技术能够应用于当代CMOS工艺。