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通过金属辅助化学蚀刻结合微振动制备硅纳米线

Fabrication of Silicon Nanowires by Metal-Assisted Chemical Etching Combined with Micro-Vibration.

作者信息

Huang Weiye, Wu Junyi, Li Wenxin, Chen Guojin, Chu Changyong, Li Chao, Zhu Yucheng, Yang Hui, Chao Yan

机构信息

School of Mechanical Engineering, Hangzhou Dianzi University, Hangzhou 310018, China.

Sanmen Sanyou Technology Inc., Taizhou 472000, China.

出版信息

Materials (Basel). 2023 Aug 5;16(15):5483. doi: 10.3390/ma16155483.

DOI:10.3390/ma16155483
PMID:37570187
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10420322/
Abstract

In this work, we design a micro-vibration platform, which combined with the traditional metal-assisted chemical etching (MaCE) to etch silicon nanowires (SiNWs). The etching mechanism of SiNWs, including in the mass-transport (MT) and charge-transport (CT) processes, was explored through the characterization of SiNW's length as a function of MaCE combined with micro-vibration conditions, such as vibration amplitude and frequency. The scanning electron microscope (SEM) experimental results indicated that the etching rate would be continuously improved with an increase in amplitude and reached its maximum at 4 μm. Further increasing amplitude reduced the etching rate and affected the morphology of the SiNWs. Adjusting the vibration frequency would result in a maximum etching rate at a frequency of 20 Hz, and increasing the frequency will not help to improve the etching effects.

摘要

在这项工作中,我们设计了一个微振动平台,该平台与传统的金属辅助化学蚀刻(MaCE)相结合来蚀刻硅纳米线(SiNWs)。通过将SiNW的长度表征为MaCE与微振动条件(如振动幅度和频率)的函数,探索了SiNWs的蚀刻机制,包括质量传输(MT)和电荷传输(CT)过程。扫描电子显微镜(SEM)实验结果表明,蚀刻速率会随着振幅的增加而持续提高,并在4μm时达到最大值。进一步增加振幅会降低蚀刻速率并影响SiNWs的形态。调整振动频率会在20Hz的频率下产生最大蚀刻速率,而增加频率无助于提高蚀刻效果。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/fc748754f2ca/materials-16-05483-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/312b47f7ac38/materials-16-05483-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/5c7d4fb72a97/materials-16-05483-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/bc512a6577b5/materials-16-05483-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/65fe4360c83c/materials-16-05483-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/37126fe437a4/materials-16-05483-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/4e57fb276e9c/materials-16-05483-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/fc748754f2ca/materials-16-05483-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/312b47f7ac38/materials-16-05483-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/5c7d4fb72a97/materials-16-05483-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/bc512a6577b5/materials-16-05483-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/65fe4360c83c/materials-16-05483-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/37126fe437a4/materials-16-05483-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/4e57fb276e9c/materials-16-05483-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d23c/10420322/fc748754f2ca/materials-16-05483-g007.jpg

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Deep Etching of Silicon Based on Metal-Assisted Chemical Etching.基于金属辅助化学蚀刻的硅的深度蚀刻
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Liquid-Metal-Assisted Growth of Vertical GaSe/MoS p-n Heterojunctions for Sensitive Self-Driven Photodetectors.
用于灵敏自驱动光电探测器的垂直GaSe/MoS p-n异质结的液态金属辅助生长
ACS Nano. 2021 Jun 22;15(6):10039-10047. doi: 10.1021/acsnano.1c01643. Epub 2021 May 26.
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Biosensors (Basel). 2020 Dec 21;10(12):213. doi: 10.3390/bios10120213.
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