Karimeddiny Saba, Cham Thow Min Jerald, Smedley Orion, Ralph Daniel C, Luo Yunqiu Kelly
Cornell University, Ithaca, NY 14850, USA.
Cornell Kavli Institute at Cornell, Ithaca, NY 14853, USA.
Sci Adv. 2023 Sep 8;9(36):eadi9039. doi: 10.1126/sciadv.adi9039.
Sagnac interferometry can provide a substantial improvement in signal-to-noise ratio compared to conventional magnetic imaging based on the magneto-optical Kerr effect. We show that this improvement is sufficient to allow quantitative measurements of current-induced magnetic deflections due to spin-orbit torque even in thin-film magnetic samples with perpendicular magnetic anisotropy, for which the Kerr rotation is second order in the magnetic deflection. Sagnac interferometry can also be applied beneficially for samples with in-plane anisotropy, for which the Kerr rotation is first order in the deflection angle. Optical measurements based on Sagnac interferometry can therefore provide a cross-check on electrical techniques for measuring spin-orbit torque. Different electrical techniques commonly give quantitatively inconsistent results so that Sagnac interferometry can help to identify which techniques are affected by unidentified artifacts.
与基于磁光克尔效应的传统磁成像相比,萨格纳克干涉测量法能够显著提高信噪比。我们表明,这种改进足以实现对由自旋轨道扭矩引起的电流感应磁偏转进行定量测量,即使在具有垂直磁各向异性的薄膜磁性样品中也是如此,对于这类样品,克尔旋转在磁偏转中是二阶的。萨格纳克干涉测量法对于具有面内各向异性的样品同样适用,对于这类样品,克尔旋转在偏转角中是一阶的。因此,基于萨格纳克干涉测量法的光学测量能够对用于测量自旋轨道扭矩的电学技术进行交叉检验。不同的电学技术通常会给出定量上不一致的结果,这样萨格纳克干涉测量法有助于识别哪些技术受到未识别假象的影响。