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用于太阳能水分解的还原氧化石墨烯对硅光电阴极的稳健 SrTiO 钝化

Robust SrTiO Passivation of Silicon Photocathode by Reduced Graphene Oxide for Solar Water Splitting.

作者信息

Ho Hsin-Chia, Smiljanić Milutin, Jovanović Zoran, Čekada Miha, Kovač Janez, Koster Gertjan, Hlinka Jiří, Hodnik Nejc, Spreitzer Matjaž

机构信息

Advanced Materials Department, Jožef Stefan Institute, 1000 Ljubljana, Slovenia.

Department of Materials Chemistry, National Institute of Chemistry, 1000 Ljubljana, Slovenia.

出版信息

ACS Appl Mater Interfaces. 2023 Sep 20;15(37):44482-44492. doi: 10.1021/acsami.3c07747. Epub 2023 Sep 11.

Abstract

Development of a robust photocathode using low-cost and high-performing materials, e.g., p-Si, to produce clean fuel hydrogen has remained challenging since the semiconductor substrate is easily susceptible to (photo)corrosion under photoelectrochemical (PEC) operational conditions. A protective layer over the substrate to simultaneously provide corrosion resistance and maintain efficient charge transfer across the device is therefore needed. To this end, in the present work, we utilized pulsed laser deposition (PLD) to prepare a high-quality SrTiO (STO) layer to passivate the p-Si substrate using a buffer layer of reduced graphene oxide (rGO). Specifically, a very thin (3.9 nm ∼10 unit cells) STO layer epitaxially overgrown on rGO-buffered Si showed the highest onset potential (0.326 V vs RHE) in comparison to the counterparts with thicker and/or nonepitaxial STO. The photovoltage, flat-band potential, and electrochemical impedance spectroscopy measurements revealed that the epitaxial photocathode was more beneficial for charge separation, charge transfer, and targeted redox reaction than the nonepitaxial one. The STO/rGO/Si with a smooth and highly epitaxial STO layer outperforming the directly contacted STO/Si with a textured and polycrystalline STO layer showed the importance of having a well-defined passivation layer. In addition, the numerous pinholes formed in the directly contacted STO/Si led to the rapid degradation of the photocathode during the PEC measurements. The stability tests demonstrated the soundness of the epitaxial STO layer in passivating Si against corrosion. This study provided a facile approach for preparing a robust protection layer over a photoelectrode substrate in realizing an efficient and, at the same time, durable PEC device.

摘要

利用低成本且高性能的材料(例如p型硅)开发一种坚固的光电阴极以生产清洁燃料氢气一直具有挑战性,因为半导体衬底在光电化学(PEC)操作条件下很容易受到(光)腐蚀。因此,需要在衬底上形成一层保护层,以同时提供耐腐蚀性并维持整个器件的高效电荷转移。为此,在本工作中,我们利用脉冲激光沉积(PLD)制备了高质量的SrTiO(STO)层,使用还原氧化石墨烯(rGO)缓冲层对p型硅衬底进行钝化。具体而言,与具有较厚和/或非外延STO的对应物相比,在rGO缓冲的硅上外延生长的非常薄(3.9纳米~10个晶胞)的STO层显示出最高的起始电位(相对于可逆氢电极,为0.326伏)。光电压、平带电位和电化学阻抗谱测量表明,外延光电阴极比非外延光电阴极更有利于电荷分离、电荷转移和目标氧化还原反应。具有光滑且高度外延的STO层的STO/rGO/Si优于具有纹理化和多晶STO层的直接接触的STO/Si,这表明拥有定义明确的钝化层很重要。此外,直接接触的STO/Si中形成的大量针孔导致PEC测量期间光电阴极迅速降解。稳定性测试证明了外延STO层在钝化硅以防止腐蚀方面的可靠性。这项研究为在光电极衬底上制备坚固的保护层提供了一种简便方法,以实现高效且同时耐用的PEC器件。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9d39/10520914/05c05d4da714/am3c07747_0001.jpg

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