Skakunova Olena S, Olikhovskii Stepan I, Radchenko Taras M, Lizunova Svitlana V, Vladimirova Tetyana P, Lizunov Vyacheslav V
G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine, Kyiv, Ukraine.
Sci Rep. 2023 Sep 24;13(1):15950. doi: 10.1038/s41598-023-43269-6.
We study the processes of dynamical diffraction of the plane X-ray waves on the graphene film/SiC substrate system in the case of the Bragg diffraction geometry. The statistical dynamical theory of X-ray diffraction in imperfect crystals is applied to the case of real quasi-two-dimensional systems. The necessity of the taking into account of the variability of the lattice parameter of multilayer graphene, as well as the influence of thickness on the thermal Debye-Waller factor at the calculation of the complex structural factors and Fourier components of polarizability, is demonstrated. It is shown that the change of the structural characteristics of the 3-layer graphene/substrate system, as well as its strained state, leads to a significant change in the diffraction profiles, which makes it possible to determine the characteristics by the X-ray diffraction method.
我们研究了在布拉格衍射几何条件下，平面X射线波在石墨烯薄膜/SiC衬底系统上的动态衍射过程。不完整晶体中X射线衍射的统计动力学理论被应用于实际的准二维系统情况。证明了在计算复结构因子和极化率的傅里叶分量时，考虑多层石墨烯晶格参数的可变性以及厚度对热德拜 - 瓦勒因子的影响的必要性。结果表明，三层石墨烯/衬底系统结构特征的变化及其应变状态会导致衍射轮廓发生显著变化，这使得通过X射线衍射方法确定其特征成为可能。
