Adamczyk Zbigniew, Sadowska Marta, Nattich-Rak Małgorzata
Jerzy Haber Institute of Catalysis and Surface Chemistry, Polish Academy of Sciences, Niezapominajek 8, 30-239 Krakow, Poland.
Langmuir. 2023 Oct 24;39(42):15067-15077. doi: 10.1021/acs.langmuir.3c02024. Epub 2023 Oct 12.
A comprehensive method consisting of theoretical modeling and experimental atomic force microscopy (AFM) measurements was developed for the quantitative analysis of nanoparticle layer topography. Analytical results were derived for particles of various shapes such as cylinders (rods), disks, ellipsoids, hemispheres (caps), etc. It was shown that for all particles, their root-mean-square () parameter exhibited a maximum at the coverage about 0.5, whereas the skewness was a monotonically decreasing function of the coverage. This enabled a facile determination of the particle coverage in the layer, even if the shape and size were not known. The validity of the analytical results was confirmed by computer modeling and experimental data acquired by AFM measurements for polymer nanoparticle deposition on mica and silica. The topographical analysis developed in this work can be exploited for a quantitative characterization of self-assembled layers of nano- and bioparticles, e.g., carbon nanotubes, silica and noble metal particles, DNA fragments, proteins, vesicles, viruses, and bacteria at solid surfaces. The acquired results also enabled a proper calibration, in particular the determination of the measurement precision, of various electron and scanning probe microscopies, such as AFM.
我们开发了一种由理论建模和实验原子力显微镜（AFM）测量组成的综合方法，用于纳米颗粒层形貌的定量分析。推导了各种形状颗粒（如圆柱体（棒）、圆盘、椭球体、半球体（帽）等）的分析结果。结果表明，对于所有颗粒，其均方根（）参数在覆盖率约为0.5时呈现最大值，而偏度是覆盖率的单调递减函数。这使得即使颗粒的形状和尺寸未知，也能够轻松确定层中的颗粒覆盖率。通过计算机建模以及对云母和二氧化硅上聚合物纳米颗粒沉积进行AFM测量获得的实验数据，证实了分析结果的有效性。这项工作中开展的形貌分析可用于对纳米颗粒和生物颗粒的自组装层进行定量表征，例如固体表面的碳纳米管、二氧化硅和贵金属颗粒、DNA片段、蛋白质、囊泡、病毒和细菌。所获得的结果还能够对各种电子显微镜和扫描探针显微镜（如AFM）进行适当校准，特别是确定测量精度。
