Bayramov Ayaz H, Bagiyev Elnur A, Alizade Elvin H, Jalilli Javid N, Mamedov Nazim T, Jahangirli Zakir A, Asadullayeva Saida G, Aliyeva Yegana N, Cuscunà Massimo, Lorenzo Daniela, Esposito Marco, Balestra Gianluca, Simeone Daniela, Tobaldi David Maria, Abou-Ras Daniel, Schorr Susan
Institute of Physics, Ministry of Science and Education, Baku Az1143, Azerbaijan.
Institute of Physical Problems, Baku State University, Ministry of Science and Education, Baku Az1148, Azerbaijan.
Nanomaterials (Basel). 2023 Dec 30;14(1):96. doi: 10.3390/nano14010096.
MoS is a two-dimensional layered transition metal dichalcogenide with unique electronic and optical properties. The fabrication of ultrathin MoS is vitally important, since interlayer interactions in its ultrathin varieties will become thickness-dependent, providing thickness-governed tunability and diverse applications of those properties. Unlike with a number of studies that have reported detailed information on direct bandgap emission from MoS monolayers, reliable experimental evidence for thickness-induced evolution or transformation of the indirect bandgap remains scarce. Here, the sulfurization of MoO thin films with nominal thicknesses of 30 nm, 5 nm and 3 nm was performed. All sulfurized samples were examined at room temperature with spectroscopic ellipsometry and photoluminescence spectroscopy to obtain information about their dielectric function and edge emission spectra. This investigation unveiled an indirect-to-indirect crossover between the transitions, associated with two different Λ and K valleys of the MoS conduction band, by thinning its thickness down to a few layers.
二硫化钼是一种具有独特电学和光学性质的二维层状过渡金属二硫属化物。超薄二硫化钼的制备至关重要,因为其超薄变体中的层间相互作用将取决于厚度,从而提供厚度可控的可调谐性以及这些性质的多种应用。与许多报道了二硫化钼单层直接带隙发射详细信息的研究不同,关于间接带隙随厚度的演化或转变的可靠实验证据仍然很少。在此,对标称厚度为30纳米、5纳米和3纳米的氧化钼薄膜进行了硫化处理。所有硫化样品在室温下用椭圆偏振光谱法和光致发光光谱法进行检测,以获取有关其介电函数和边缘发射光谱的信息。这项研究揭示了通过将其厚度减薄至几层,在与二硫化钼导带的两个不同Λ和K谷相关的跃迁之间发生了间接带隙到间接带隙的转变。