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心脏植入式电子设备引起的三尖瓣反流:影响和管理。

Cardiac implantable electronic device-induced tricuspid regurgitation: Implications and management.

机构信息

Division of Cardiology, Massachusetts General Hospital, Boston, Massachusetts, USA.

Cardiac Ultrasound Laboratory, Massachusetts General Hospital, Boston, Massachusetts, USA.

出版信息

J Cardiovasc Electrophysiol. 2024 May;35(5):1017-1025. doi: 10.1111/jce.16251. Epub 2024 Mar 19.

Abstract

Tricuspid regurgitation (TR) secondary to cardiac implantable electronic devices (CIEDs) has been well documented and is associated with worse cardiovascular outcomes. A variety of mechanisms have been proposed including lead-induced mechanical disruption of the tricuspid valvular or subvalvular apparatus and pacing-induced electrical dyssynchrony. Patient characteristics such as age, sex, baseline atrial fibrillation, and pre-existing TR have not been consistent predictors of CIED-induced TR. While two-dimensional echocardiography is helpful in assessing the severity of TR, three-dimensional echocardiography has significantly improved accuracy in identifying the etiology of TR and whether lead position contributes to TR. Three-dimensional echocardiography may therefore play a future role in optimizing lead positioning during implant to reduce the risk of CIED-induced TR. Optimal lead management strategies in addition to percutaneous interventions and surgery in alleviating TR are very important.

摘要

三尖瓣反流(TR)继发于心脏植入式电子设备(CIEDs)已有充分的文献记载,并与心血管不良结局相关。已经提出了多种机制,包括导丝引起的三尖瓣瓣叶或瓣下装置的机械性破坏和起搏引起的电不同步。患者特征如年龄、性别、基线心房颤动和预先存在的 TR 并不是 CIED 引起的 TR 的一致预测因素。虽然二维超声心动图有助于评估 TR 的严重程度,但三维超声心动图在识别 TR 的病因以及导丝位置是否导致 TR 方面显著提高了准确性。因此,三维超声心动图可能在未来优化植入过程中的导丝定位以降低 CIED 引起的 TR 风险方面发挥作用。除了经皮介入和手术外,缓解 TR 的最佳导丝管理策略也非常重要。

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