Zhang Peng, Wang Yimeng, Su Xueqiong, Zhang Qiwen, Sun Mingyu
Institute of Photonic Chips, University of Shanghai for Science and Technology, Shanghai 200093, China.
Centre for Artificial-Intelligence Nanophotonics, School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China.
Nanomaterials (Basel). 2024 Mar 22;14(7):558. doi: 10.3390/nano14070558.
Multi-exciton generation by multi-photon absorption under low-energy photons can be thought a reasonable method to reduce the risk of optical damage, especially in photoelectric quantum dot (QD) devices. The lifetime of the multi-exciton state plays a key role in the utilization of photon-induced carriers, which depends on the dynamics of the exciton generation process in materials. In this paper, the exciton generation dynamics of the photon absorption under low-frequency light in CdSe QDs are successfully detected and studied by the temporal resolution transient absorption (TA) spectroscopy method. Since the cooling time of hot excitons extends while the rate of auger recombination is accelerated when incident energy is increased, the filling time of defect states is irregular, and exciton generation experiences a transition from single-photon absorption to multi-photon absorption. This result shows how to change the excitation. Optical parameters can prolong the lifetime of excitons, thus fully extracting excitons and improving the photoelectric conversion efficiency of QD optoelectronic devices, which provides theoretical and experimental support for the development of QD optoelectronic devices.
在低能光子作用下通过多光子吸收产生多激子可被认为是一种降低光损伤风险的合理方法,尤其是在光电量子点(QD)器件中。多激子态的寿命在光子诱导载流子的利用中起着关键作用,这取决于材料中激子产生过程的动力学。本文通过时间分辨瞬态吸收(TA)光谱法成功检测并研究了CdSe量子点中低频光下光子吸收的激子产生动力学。由于当入射能量增加时热激子的冷却时间延长而俄歇复合速率加快,缺陷态的填充时间不规则,并且激子产生经历从单光子吸收到多光子吸收的转变。该结果表明如何改变激发。光学参数可以延长激子寿命,从而充分提取激子并提高量子点光电器件的光电转换效率,这为量子点光电器件的发展提供了理论和实验支持。