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惰性气体在制备高透明导电氧化铟锡薄膜中的整体应用

Monolithic Use of Inert Gas for Highly Transparent and Conductive Indium Tin Oxide Thin Films.

作者信息

Alabdan Hessa I, Alsahli Fahad M, Bhandari Shubhranshu, Mallick Tapas

机构信息

Environment and Sustainability Institute, University of Exeter, Penryn Campus, Cornwall TR10 9FE, UK.

Department of Physics and Renewable Energy, College of Science and Humanities-Jubail, Imam Abdulrahman Bin Faisal University, Jubail 35811, Saudi Arabia.

出版信息

Nanomaterials (Basel). 2024 Mar 24;14(7):565. doi: 10.3390/nano14070565.

Abstract

Due to its excellent electrical conductivity, high transparency in the visible spectrum, and exceptional chemical stability, indium tin oxide (ITO) has become a crucial material in the fields of optoelectronics and nanotechnology. This article provides a thorough analysis of growing ITO thin films with various thicknesses to study the impact of thickness on their electrical, optical, and physical properties for solar-cell applications. ITO was prepared through radio frequency (RF) magnetron sputtering using argon gas with no alteration in temperature or changes in substrate heating, followed with annealing in a tube furnace under inert conditions. An investigation of the influence of thickness on the optical, electrical, and physical properties of the films was conducted. We found that the best thickness for ITO thin films was 100 nm in terms of optical, electrical, and physical properties. To gain full comprehension of the impact on electrical properties, the different samples were characterized using a four-point probe and, interestingly, we found a high conductivity in the range of 1.8-2 × 10 S/m, good resistivity that did not exceed 1-2 × 10 Ωm, and a sheet resistance lower than 16 Ω sq. The transparency values found using a spectrophotometer reached values beyond 85%, which indicates the high purity of the thin films. Atomic force microscopy indicated a smooth morphology with low roughness values for the films, indicating an adequate transitioning of the charges on the surface. Scanning electron microscopy was used to study the actual thicknesses and the morphology, through which we found no cracks or fractures, which implied excellent deposition and annealing. The X-ray diffraction microscopy results showed a high purity of the crystals, as the peaks (222), (400), (440), and (622) of the crystallographic plane reflections were dominant, which confirmed the existence of the faced-center cubic lattice of ITO. This work allowed us to design a method for producing excellent ITO thin films for solar-cell applications.

摘要

由于氧化铟锡(ITO)具有出色的导电性、在可见光谱范围内的高透明度以及卓越的化学稳定性,它已成为光电子学和纳米技术领域的关键材料。本文对生长不同厚度的ITO薄膜进行了全面分析,以研究厚度对其用于太阳能电池应用的电学、光学和物理性能的影响。ITO是通过射频(RF)磁控溅射制备的,使用氩气,温度不变且不改变衬底加热情况,随后在惰性条件下于管式炉中进行退火。对薄膜厚度对其光学、电学和物理性能的影响进行了研究。我们发现,就光学、电学和物理性能而言,ITO薄膜的最佳厚度为100纳米。为了全面理解对电学性能的影响,使用四点探针表征了不同样品,有趣的是,我们发现其电导率在1.8 - 2×10 S/m范围内较高,电阻率良好,不超过1 - 2×10 Ωm,方块电阻低于16 Ω/sq。使用分光光度计测得的透明度值超过85%,这表明薄膜的纯度很高。原子力显微镜显示薄膜具有光滑的形态,粗糙度值较低,这表明表面电荷有良好的转移。使用扫描电子显微镜研究实际厚度和形态,我们发现没有裂纹或裂缝,这意味着沉积和退火效果极佳。X射线衍射显微镜结果显示晶体纯度很高,因为晶面反射的(222)、(400)、(440)和(622)峰占主导,这证实了ITO面心立方晶格的存在。这项工作使我们能够设计出一种生产用于太阳能电池应用的优质ITO薄膜的方法。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fcc7/11013042/cb7728678e1d/nanomaterials-14-00565-g001.jpg

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