Ma Youshuo, Li Xin, Zhang Hongyu
School of Materials Science and Engineering, Tianjin University, Tianjin 300350, China.
Tianjin University Binhai Industrial Research Institute Co., Ltd., Tianjin 300350, China.
Materials (Basel). 2024 Apr 17;17(8):1844. doi: 10.3390/ma17081844.
Gold-plated substrate is widely used in sintering with silver paste because of its high conductivity, stability, and corrosion resistance. However, due to massive interdiffusion between Ag and Au atoms, it is challenging for sintered Ag-Au joints to maintain high reliability. In order to study the effect of grain structure of gold plating layer on the environmental reliability of sintered Ag-Au joints, we prepared four substrates with different gold structures. In addition to the original gold structure (Au substrate), other gold structures were obtained by heat treatment at temperatures of 150 °C (Au-150 substrate), 250 °C (Au-250 substrate), and 350 °C (Au-350 substrate) for 1 h. Compared with the other three gold substrates, the sinter jointed on the Au-350 substrate obtained the highest shear strength. By analyzing the grain structure of the gold plating layer, it is found that the average grain size of the Au-350 substrate is the largest, and the proportion of low-angle grain boundaries is less. Few grain boundaries have a positive impact on inhibiting the excessive diffusion of Ag atoms and improving the bonding performance of the joint. Based on the above study, we further evaluated the environmental reliability of sintered joints. In 150 °C high-thermal storage, the interdiffusion of Ag and Au in the sintered joint on the Au-350 substrate was restricted, retaining stronger bonding until 200 h. In a hygrothermal environment of 85 °C/85% RH, the shear strength of the sintered Ag-Au joint with the Au-350 substrate maintained above 40.2 MPa during 100 h aging. The results indicated that the sintered Ag-Au joint on the Au-350 substrate with the largest grain size has superior high thermal reliability and hygrothermal reliability.
镀金基板因其高导电性、稳定性和耐腐蚀性而广泛用于与银浆烧结。然而,由于银和金原子之间的大量相互扩散,烧结的银-金接头要保持高可靠性具有挑战性。为了研究镀金层的晶粒结构对烧结银-金接头环境可靠性的影响,我们制备了四种具有不同金结构的基板。除了原始的金结构(金基板)外,其他金结构是通过在150°C(Au-150基板)、250°C(Au-250基板)和350°C(Au-350基板)的温度下热处理1小时获得的。与其他三种金基板相比,在Au-350基板上烧结的接头获得了最高的剪切强度。通过分析镀金层的晶粒结构,发现Au-350基板的平均晶粒尺寸最大,低角度晶界的比例较小。很少有晶界对抑制银原子的过度扩散和改善接头的结合性能有积极影响。基于上述研究,我们进一步评估了烧结接头的环境可靠性。在150°C的高热存储条件下,Au-350基板上烧结接头中银和金的相互扩散受到限制,在200小时之前保持较强的结合力。在85°C/85%RH的湿热环境中,具有Au-350基板的烧结银-金接头在100小时老化过程中的剪切强度保持在40.2MPa以上。结果表明,具有最大晶粒尺寸的Au-350基板上的烧结银-金接头具有优异的高热可靠性和湿热可靠性。