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评估自由落体条件对鹰嘴豆种子损伤的影响:种子劣变的全面考察。

Assessing the effects of free fall conditions on damage to chickpea seeds: A comprehensive examination of seed deterioration.

作者信息

Delfan Farzad, Shahbazi Feizollah, Eisvand Hamid Reza, Shahbazi Saba

机构信息

Faculty of Agriculture Lorestan University Khoramabbad Iran.

Bushehr University of Medical Sciences Bushehr Iran.

出版信息

Food Sci Nutr. 2024 Feb 20;12(5):3714-3724. doi: 10.1002/fsn3.4041. eCollection 2024 May.

Abstract

Impact damage is the most destructive effect on the seeds during harvesting, handling, and storage, both on-farm and off-farm. The chickpea seeds' dicotyledonous characteristics and large mass and size make them susceptible to mechanical damage under impact loading. Tests were conducted to determine the extent of damage to chickpea seeds due to the impact caused by free fall. The extent of internal damage to the chickpea seeds was determined, which included the measurement of seed deterioration by the accelerated aging method (percentage loss in germination in the accelerated aging test) and the measurement of electrical conductivity. Three independent variables were used in the test, namely: (a) drop height (3, 6, 9, and 12 m), (b) impact surface (concrete, metal, plywood and seeds on seeds), and (c) seed moisture content (10%, 15%, 20%, and 25% w.b). The results showed that drop height, impact surface, and moisture content had significant effects ( < .01) on the loss in germination percentage and change in electrical conductivity of chickpea seeds. In terms of loss in germination, the highest damage to seeds occurred at the metal impact surface (41.96%) and the least at the seed on the seed (29.71%). The highest amount of electrical conductivity was related to the seeds dropped on the metal (36.09 μS cm g) and the lowest was related to seed-on-seed contact (21.68 μS cm g). By increasing the drop height from 3 to 12 m, the loss in germination and electrical conductivity of seeds increased from 27.74% to 48.08% and from 18.72 to 40.47 μS cm g, respectively. Increasing the moisture content of chickpea seeds from 10 to 25% causes a decrease in the amount of damage to the seeds in terms of electrical conductivity (from 38.40 to 21.18 μS cm g), but increases the damage in the form of a loss in the percentage germination in the accelerated aging test (from 29.22% to 42.88%). To reduce the impact damage to peas caused by free fall, the height of the fall should be limited to about 6 m, and they should be prevented from hitting hard and rough surfaces.

摘要

在农场内外的收获、处理和储存过程中,冲击损伤对种子具有最具破坏性的影响。鹰嘴豆种子的双子叶特征以及较大的质量和尺寸使其在冲击载荷下易受机械损伤。进行了试验以确定由于自由落体造成的冲击对鹰嘴豆种子的损伤程度。测定了鹰嘴豆种子的内部损伤程度,包括通过加速老化法测量种子劣变(加速老化试验中的发芽率损失百分比)和测量电导率。试验中使用了三个自变量,即:(a) 下落高度(3、6、9和12米),(b) 冲击表面(混凝土、金属、胶合板和种子对种子),以及(c) 种子含水量(10%、15%、20%和25%湿基)。结果表明,下落高度、冲击表面和含水量对鹰嘴豆种子的发芽率损失和电导率变化有显著影响(<0.01)。就发芽率损失而言,种子在金属冲击表面的损伤最大(41.96%),在种子对种子的情况下损伤最小(29.71%)。最高的电导率与掉落在金属上的种子有关(36.09 μS cm g),最低的与种子对种子接触有关(21.68 μS cm g)。将下落高度从3米增加到12米时,种子的发芽率损失和电导率分别从27.74%增加到48.08%以及从18.72增加到40.47 μS cm g。将鹰嘴豆种子的含水量从10%增加到25%,就电导率而言,种子的损伤量会减少(从38.40降至21.18 μS cm g),但在加速老化试验中以发芽率损失形式出现的损伤会增加(从29.22%增加到42.88%)。为减少自由落体对豌豆造成的冲击损伤,下落高度应限制在约6米,并应防止其撞击坚硬和粗糙表面。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e1ac/11077221/790d7f137390/FSN3-12-3714-g005.jpg

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