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基于干涉仪的芯片级化学传感器,具有增强的响应度和低成本检测方法。

Interferometer-based chemical sensor on chip with enhanced responsivity and low-cost interrogation.

作者信息

Piretta Flaminia, Samà Francesca, Bontempi Francesca, Elaskar Javier, Angeloni Debora, Oton Claudio J

机构信息

Scuola Superiore Sant'Anna, Institute of Mechanical Intelligence, Via G. Moruzzi 1, 56124, Pisa, Italy.

Scuola Superiore Sant'Anna, Institute of Biorobotics, Viale Rinaldo Piaggio 34, 56025, Pontedera, Italy.

出版信息

Biomed Opt Express. 2024 Apr 3;15(5):2767-2779. doi: 10.1364/BOE.520195. eCollection 2024 May 1.

DOI:10.1364/BOE.520195
PMID:38855700
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC11161349/
Abstract

We report experimental results of an interferometric chemical sensor integrated on a silicon chip. The sensor measures refractive index variations of the liquid that contacts exposed spiraled silicon waveguides on one branch of a Mach-Zehnder interferometer. The system requires neither laser tuning nor spectral analysis, but a laser at a fixed wavelength, and a demodulation architecture that includes an internal phase modulator and a real-time processing algorithm based on multitone mixing. Two devices are compared in terms of sensitivity and noise, one at 1550 nm wavelength and TE polarization, and an optimized device at 1310 nm and TM polarization, which shows 3 times higher sensitivity and a limit of detection of 2.24·10 RIU.

摘要

我们报告了集成在硅芯片上的干涉式化学传感器的实验结果。该传感器测量与马赫-曾德尔干涉仪一个分支上暴露的螺旋形硅波导接触的液体的折射率变化。该系统既不需要激光调谐也不需要光谱分析,而是需要一个固定波长的激光器,以及一种解调架构,该架构包括一个内部相位调制器和基于多音混合的实时处理算法。在灵敏度和噪声方面对两个器件进行了比较,一个是波长为1550 nm、TE偏振的器件,另一个是优化后的波长为1310 nm、TM偏振的器件,后者的灵敏度高出3倍,检测限为2.24·10 RIU。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/33589ac85ea0/boe-15-5-2767-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/6322a14e2755/boe-15-5-2767-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/75049dd6e7af/boe-15-5-2767-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/8875c42eab3e/boe-15-5-2767-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/75736e559881/boe-15-5-2767-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/72db715067db/boe-15-5-2767-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/f0a2d93afe8f/boe-15-5-2767-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/fb20f2c924a0/boe-15-5-2767-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/cb4bad0b117d/boe-15-5-2767-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/a8da07adaea6/boe-15-5-2767-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/33589ac85ea0/boe-15-5-2767-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/6322a14e2755/boe-15-5-2767-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/75049dd6e7af/boe-15-5-2767-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/8875c42eab3e/boe-15-5-2767-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/75736e559881/boe-15-5-2767-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/72db715067db/boe-15-5-2767-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/f0a2d93afe8f/boe-15-5-2767-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/fb20f2c924a0/boe-15-5-2767-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/cb4bad0b117d/boe-15-5-2767-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/a8da07adaea6/boe-15-5-2767-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/95f1/11161349/33589ac85ea0/boe-15-5-2767-g010.jpg

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本文引用的文献

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Refractive index dispersion measurement in the short-wave infrared range using synthetic phase microscopy.使用合成相显微镜在短波红外范围内测量折射率色散。
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