Hu Ziyang, Zhang Yiqian, Maiden Andrew
Opt Lett. 2024 Sep 1;49(17):4839-4842. doi: 10.1364/OL.529190.
We introduce a method for the computational sectioning of optically thick samples based on a combination of near-field and multi-slice ptychography. The method enables a large field-of-view 3D phase imaging of samples that is an order of magnitude thicker than the depth of field of bright-field microscopy. An axial resolution for these thick samples is maintained in the presence of multiple scattering, revealing a complex structure beyond the depth of the field limit. In this Letter, we describe the new, to the best of our knowledge, approach and demonstrate its effectiveness using a range of samples with diverse thicknesses and optical properties.
我们介绍了一种基于近场和多切片叠层成像技术相结合的方法,用于对光学厚样品进行计算切片。该方法能够对样品进行大视场三维相位成像,样品厚度比明场显微镜的景深厚一个数量级。在存在多重散射的情况下,这些厚样品仍能保持轴向分辨率,揭示出场深极限之外的复杂结构。在本信函中,据我们所知,我们描述了这种新方法,并使用一系列具有不同厚度和光学特性的样品证明了其有效性。