Research on the Method of Imperfect Wheat Grain Recognition Utilizing Hyperspectral Imaging Technology.

As the primary grain crop in China, wheat holds a significant position in the country's agricultural production, circulation, consumption, and various other aspects. However, the presence of imperfect grains has greatly impacted wheat quality and, subsequently, food security. In order to detect perfect wheat grains and six types of imperfect grains, a method for the fast and non-destructive identification of imperfect wheat grains using hyperspectral images was proposed. The main contents and results are as follows: (1) We collected wheat grain hyperspectral data. Seven types of wheat grain samples, each containing 300 grains, were prepared to construct a hyperspectral imaging system for imperfect wheat grains, and visible near-infrared hyperspectral data from 2100 wheat grains were collected. The Savitzky-Golay algorithm was used to analyze the hyperspectral images of wheat grains, selecting 261 dimensional effective hyperspectral datapoints within the range of 420.61-980.43 nm. (2) The Successive Projections Algorithm was used to reduce the dimensions of the 261 dimensional hyperspectral datapoints, selecting 33 dimensional hyperspectral datapoints. Principal Component Analysis was used to extract the optimal spectral wavelengths, specifically selecting hyperspectral images at 647.57 nm, 591.78 nm, and 568.36 nm to establish the dataset. (3) Particle Swarm Optimization was used to optimize the Support Vector Machines model, Convolutional Neural Network model, and MobileNet V2 model, which were established to recognize seven types of wheat grains. The comprehensive recognition rates were 93.71%, 95.14%, and 97.71%, respectively. The results indicate that a larger model with more parameters may not necessarily yield better performance. The research shows that the MobileNet V2 network model exhibits superior recognition efficiency, and the integration of hyperspectral image technology with the classification model can accurately identify imperfect wheat grains.