Suppr超能文献

层内/层间共掺杂稳定二维半导体中的极性调制以用于可扩展电子学。

Intralayer/Interlayer Codoping Stabilizes Polarity Modulation in 2D Semiconductors for Scalable Electronics.

作者信息

Qiu Guitian, Kong Lingan, Han Mengjiao, Zhang Qian, Rehman Majeed Ur, Yi Jianxian, Xian Lede, Lin Xiankai, Abbas Aumber, Chen Jiwei, Luo Yingjie, Li Wenbo, Wei Zhongchao, Meng Hongyun, Ma Xiuliang, Liang Qijie

机构信息

School of Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou, 510006, China.

Songshan Lake Materials Laboratory, Dongguan, 523808, China.

出版信息

Adv Sci (Weinh). 2024 Dec;11(48):e2408634. doi: 10.1002/advs.202408634. Epub 2024 Oct 24.

Abstract

2D semiconductors show promise as a competitive candidate for developing future integrated circuits due to their immunity to short-channel effects and high carrier mobility at atomic layer thicknesses. The inherent defects and Fermi level pinning effect lead to n-type transport characteristics in most 2D semiconductors, while unstable and unsustainable p-type doping by various strategies hinders their application in many areas, such as complementary metal-oxide-semiconductor (CMOS) devices. In this study, an intralayer/interlayer codoping strategy is introduced that stabilizes p-type doping in 2D semiconductors. By incorporating oppositely charged ions (F and Li) with the intralayer/interlayer of 2D semiconductors, remarkable p-type doping in WSe and MoTe with air stability up to 9 months is achieved. Notably, the hole mobility presents a 100-fold enhancement (0.7 to 92 cm V s) with the codoping procedure. Structural and elemental characterizations, combined with theoretical calculations validate the codoping mechanism. Moreover, a CMOS inverter and more complex logic functions such as NOR and XNOR, as well as large-area device arrays are demonstrated to showcase its applications and scalability. These findings suggest that stable and straightforward intralayer/interlayer codoping strategy with charge-space synergy holds the key to unlocking the potential of 2D semiconductors in complex and scalable device applications.

摘要

二维半导体因其对短沟道效应具有免疫性以及在原子层厚度下具有高载流子迁移率,有望成为开发未来集成电路的有竞争力候选材料。固有缺陷和费米能级钉扎效应导致大多数二维半导体呈现n型输运特性,而通过各种策略进行的不稳定且不可持续的p型掺杂阻碍了它们在许多领域的应用,如互补金属氧化物半导体(CMOS)器件。在本研究中,引入了一种层内/层间共掺杂策略,该策略可稳定二维半导体中的p型掺杂。通过在二维半导体的层内/层间引入带相反电荷的离子(F和Li),在WSe和MoTe中实现了显著的p型掺杂,其空气稳定性高达9个月。值得注意的是,通过共掺杂过程,空穴迁移率提高了100倍(从0.7提高到92 cm² V⁻¹ s⁻¹)。结构和元素表征以及理论计算验证了共掺杂机制。此外,展示了一个CMOS反相器以及更复杂的逻辑功能,如或非门和异或非门,还有大面积器件阵列,以展示其应用和可扩展性。这些发现表明,具有电荷 - 空间协同作用的稳定且直接的层内/层间共掺杂策略是释放二维半导体在复杂且可扩展器件应用中潜力的关键。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/963b/11672281/dadd135273e4/ADVS-11-2408634-g002.jpg

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验