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双梳状显微镜中 confocal 振幅图像与 confocal 相位图像之间的相干链接。

Coherent linking between confocal amplitude image and confocal phase image in dual-comb microscopy.

作者信息

Mizuno Takahiko, Tsuda Takuya, Hase Eiji, Yamamoto Hirotsugu, Minamikawa Takeo, Yasui Takeshi

机构信息

Institute of Post-LED Photonics (pLED), Tokushima University, 2-1 Minami-Josanjima, Tokushima, Tokushima, 770-8506, Japan.

Graduate School of Advanced Technology and Science, Tokushima University, 2-1 Minami-Josanjima, Tokushima, Tokushima, 770-8506, Japan.

出版信息

Sci Rep. 2024 Oct 27;14(1):25649. doi: 10.1038/s41598-024-76865-1.

Abstract

We propose a method for integrating confocal amplitude and phase images obtained through dual-comb microscopy (DCM). DCM combines the benefits of confocal laser microscopy and quantitative phase microscopy, offering high axial resolution and scan-less imaging. By leveraging the coherence between confocal amplitude and phase images within the same DCM system, we accurately determine the number of phase wrapping iterations, thereby eliminating ambiguity in phase wrapping. We demonstrate this approach using samples with micrometer-range optical thickness and nanometer-scale surface roughness. The results demonstrate an expanded axial range, spanning from micrometers to millimeters, while maintaining nanometer-level axial resolution. This integrated DCM imaging technique enables the simultaneous acquisition of confocal amplitude image and absolute phase image, thus enhancing its potential for wide-axial-dynamic-range imaging across various applications.

摘要

我们提出了一种用于整合通过双梳显微镜(DCM)获得的共焦幅度和相位图像的方法。DCM结合了共焦激光显微镜和定量相位显微镜的优点,提供高轴向分辨率和无扫描成像。通过利用同一DCM系统中共焦幅度和相位图像之间的相干性,我们准确地确定了相位包裹迭代的次数,从而消除了相位包裹中的模糊性。我们使用具有微米级光学厚度和纳米级表面粗糙度的样品来演示这种方法。结果表明轴向范围得到了扩展,从微米到毫米,同时保持纳米级轴向分辨率。这种集成的DCM成像技术能够同时采集共焦幅度图像和绝对相位图像,从而增强了其在各种应用中进行宽轴向动态范围成像的潜力。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ac6f/11514158/68f1909d0598/41598_2024_76865_Fig1_HTML.jpg

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