Jaugstetter Maximilian, Qi Xiao, Chan Emory M, Salmeron Miquel, Wilson Kevin R, Nemšák Slavomír, Bluhm Hendrik
Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
ACS Nano. 2025 Jan 14;19(1):418-426. doi: 10.1021/acsnano.4c08846. Epub 2024 Dec 19.
Functionalization and volatilization are competing reactions during the oxidation of carbonaceous materials and are important processes in many different areas of science and technology. Here, we present a combined ambient pressure X-ray photoelectron spectroscopy (APXPS) and grazing incidence X-ray scattering (GIXS) investigation of the oxidation of oleic acid ligands surrounding NaYF nanoparticles (NPs) deposited onto SiO/Si substrates. While APXPS monitors the evolution of the oxidation products, GIXS provides insight into the morphology of the ligands and particles before and after the oxidation. Our investigation shows that the oxidation of the oleic acid ligands proceeds at O partial pressures of below 1 mbar in the presence of X-rays, with the oxidation eventually reaching a steady state in which mainly CH and -COOH functional groups are observed. The scattering data reveal that the oxidation and volatilization reaction proceeds preferentially on the side of the particle facing the gas phase, leading to the formation of a chemically and morphologically asymmetric ligand layer. This comprehensive picture of the oxidation process could be obtained only by combining the X-ray scattering and APXPS data. The investigation presented here lays the foundation for further studies of the stability of NP layers in the presence of reactive trace gases and ionizing radiation and for other nanoscale systems where chemical and morphological changes happen simultaneously and cannot be understood in isolation.
在含碳材料的氧化过程中,官能化和挥发是相互竞争的反应,并且是许多不同科学技术领域中的重要过程。在此,我们展示了一项结合常压X射线光电子能谱(APXPS)和掠入射X射线散射(GIXS)的研究,该研究针对沉积在SiO/Si衬底上的NaYF纳米颗粒(NP)周围油酸配体的氧化。当APXPS监测氧化产物的演变时,GIXS提供了氧化前后配体和颗粒形态的相关见解。我们的研究表明,在X射线存在的情况下,油酸配体的氧化在O分压低于1毫巴时进行,氧化最终达到稳态,此时主要观察到CH和-COOH官能团。散射数据表明,氧化和挥发反应优先在颗粒面向气相的一侧进行,导致形成化学和形态不对称的配体层。只有通过结合X射线散射和APXPS数据才能获得氧化过程的这一全面情况。本文所展示的研究为进一步研究在存在反应性痕量气体和电离辐射的情况下NP层的稳定性以及其他化学和形态变化同时发生且不能孤立理解的纳米级系统奠定了基础。