Chen Nan, Ramzan Iqra, Li Shuhui, Carmalt Claire J
Materials Chemistry Center, Department of Chemistry, University College London, 20 Gordon Street, London WC1H 0AJ, U.K.
Cryst Growth Des. 2024 Dec 4;24(24):10256-10266. doi: 10.1021/acs.cgd.4c01238. eCollection 2024 Dec 18.
Mo-doped ZnO (MZO), F-doped ZnO (FZO), and Mo/F-codoped ZnO (MFZO) films have been deposited using a simple, cheap, and effective thin-film preparation route, aerosol-assisted chemical vapor deposition (AACVD). ZnO was successfully doped with Mo and/or F, confirmed by X-ray photoelectron spectroscopy (XPS) and by a decrease in unit cell parameters from X-ray diffraction (XRD). XRD also confirmed that all of the films had hexagonal wurtzite ZnO structures. Scanning electron microscopy showed that all of the films had well-defined surface features. The undoped ZnO film had a high resistivity of ∼10 Ω·cm, determined by Hall effect measurements, and a visible light transmittance of 72%, determined by ultraviolet-visible (UV-vis)-IR spectroscopy. The transmittance of the doped and codoped films was improved to 75-85%. The ZnO film codoped with 6.2 atom% Mo and 3.6 atom% F, deposited at 550 °C achieved the minimum resistance (5.084 × 10 Ω·cm) with a significant improvement in carrier concentration (5.483 × 10 cm) and mobility (21.78 cm V s).
采用一种简单、廉价且有效的薄膜制备方法——气溶胶辅助化学气相沉积(AACVD),沉积了掺钼氧化锌(MZO)、掺氟氧化锌(FZO)和钼/氟共掺氧化锌(MFZO)薄膜。通过X射线光电子能谱(XPS)以及X射线衍射(XRD)显示的晶胞参数减小,证实了氧化锌成功掺杂了钼和/或氟。XRD还证实所有薄膜均具有六方纤锌矿氧化锌结构。扫描电子显微镜表明所有薄膜都具有清晰的表面特征。通过霍尔效应测量确定,未掺杂的氧化锌薄膜具有约10Ω·cm的高电阻率,通过紫外可见近红外光谱(UV-vis-IR)确定其可见光透过率为72%。掺杂和共掺杂薄膜的透过率提高到了75% - 85%。在550°C下沉积的含有6.2原子%钼和3.6原子%氟的共掺氧化锌薄膜实现了最小电阻(5.084×10Ω·cm),载流子浓度(5.483×10cm)和迁移率(21.78cm²V⁻¹s⁻¹)有显著提高。