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关于硅集成电路的寿命和固有密封性:加速老化和植入研究后裸芯片和聚二甲基硅氧烷涂层集成电路的评估。

On the longevity and inherent hermeticity of silicon-ICs: evaluation of bare-die and PDMS-coated ICs after accelerated aging and implantation studies.

作者信息

Nanbakhsh Kambiz, Shah Idil Ahmad, Lamont Callum, Dücső Csaba, Akgun Ömer Can, Horváth Domonkos, Tóth Kinga, Meszéna Domokos, Ulbert István, Mazza Federico, Constandinou Timothy G, Serdijn Wouter, Vanhoestenberghe Anne, Donaldson Nick, Giagka Vasiliki

机构信息

Department of Microelectronics, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Delft, The Netherlands.

Department of Medical Physics and Biomedical Engineering, University College London, London, UK.

出版信息

Nat Commun. 2025 Jan 2;16(1):12. doi: 10.1038/s41467-024-55298-4.

Abstract

Silicon integrated circuits (ICs) are central to the next-generation miniature active neural implants, whether packaged in soft polymers for flexible bioelectronics or implanted as bare die for neural probes. These emerging applications bring the IC closer to the corrosive body environment, raising reliability concerns, particularly for chronic use. Here, we evaluate the inherent hermeticity of bare die ICs, and examine the potential of polydimethylsiloxane (PDMS), a moisture-permeable elastomer, as a standalone encapsulation material. For this aim, the electrical and material performance of ICs sourced from two foundries was evaluated through one-year accelerated in vitro and in vivo studies. ICs featured custom-designed test structures and were partially PDMS coated, creating two regions on each chip, uncoated "bare die" and "PDMS-coated". During the accelerated in vitro study, ICs were electrically biased and periodically monitored. Results revealed stable electrical performance, indicating the unaffected operation of ICs even when directly exposed to physiological fluids. Despite this, material analysis revealed IC degradation in the bare regions. PDMS-coated regions, however, revealed limited degradation, making PDMS a suitable IC encapsulant for years-long implantation. Based on the new insights, guidelines are proposed that may enhance the longevity of implantable ICs, broadening their applications in the biomedical field.

摘要

硅集成电路(IC)对于下一代微型有源神经植入物至关重要,无论是封装在用于柔性生物电子学的软聚合物中,还是作为裸片植入神经探针。这些新兴应用使集成电路更接近具有腐蚀性的人体环境,引发了对可靠性的担忧,尤其是对于长期使用而言。在这里,我们评估了裸片集成电路的固有密封性,并研究了聚二甲基硅氧烷(PDMS)这种透湿性弹性体作为独立封装材料的潜力。为此,通过为期一年的加速体外和体内研究,评估了来自两家代工厂的集成电路的电气和材料性能。集成电路具有定制设计的测试结构,并部分涂覆了PDMS,在每个芯片上形成了两个区域,未涂覆的“裸片”和“PDMS涂覆的”区域。在加速体外研究期间,对集成电路施加电偏置并定期监测。结果显示出稳定的电气性能,表明即使直接暴露于生理流体中,集成电路的运行也未受影响。尽管如此,材料分析显示裸片区域存在集成电路降解。然而,PDMS涂覆的区域显示出有限的降解,这使得PDMS成为适合长期植入的集成电路封装材料。基于这些新见解,提出了一些指导方针,可能会提高可植入集成电路的使用寿命,拓宽它们在生物医学领域的应用。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0da8/11697292/020e707c8495/41467_2024_55298_Fig1_HTML.jpg

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