Tivol W F, Barnard D, Guha T
Scan Electron Microsc. 1985(Pt 1):455-66.
X-Ray microprobe (XMA) and electron energy-loss (EELS) spectrometers have been installed on the high-voltage electron microscope (HVEM). The probe size has been measured and background reduction is in progress for XMA and EELS as are improvements in electron optics for EELS and sensitivity measurements. XMA is currently useful for qualitative analysis and has been used by several investigators from our laboratory and outside laboratories. However, EELS background levels are still too high for meaningful results to be obtained. Standards suitable for biological specimens are being measured, and a library for quantitative analysis is being compiled.
X射线微探针（XMA）和电子能量损失谱仪（EELS）已安装在高压电子显微镜（HVEM）上。已测量了探针尺寸，目前正在进行XMA和EELS的背景降低工作，同时也在改进EELS的电子光学系统和进行灵敏度测量。XMA目前可用于定性分析，我们实验室和外部实验室的几位研究人员已经使用过。然而，EELS的背景水平仍然过高，无法获得有意义的结果。目前正在测量适用于生物标本的标准物质，并正在编制用于定量分析的数据库。
