Lord Alex M, Consonni Vincent, Donatini Fabrice, Kepaptsoglou Demie M, Ramasse Quentin M, Evans Jon E, Allen Martin W, S'ari Mark, Hathaway Mac, Groot Irene M N
Centre for NanoHealth, College of Engineering, Swansea University, Swansea SA2 8PP, United Kingdom.
Leiden Institute of Chemistry, Universiteit Leiden, PO Box 9502, Leiden 2300 RA, Netherlands.
ACS Appl Mater Interfaces. 2025 Mar 26;17(12):18996-19011. doi: 10.1021/acsami.4c17872. Epub 2025 Mar 12.
Schottky diodes have been a fundamental component of electrical circuits for many decades, and intense research continues to this day on planar materials with increasingly exotic compounds. With the birth of nanotechnology, a paradigm shift occurred with Schottky contacts proving to be essential for enabling nanodevice inventions and increasing their performance by many orders of magnitude, particularly in the fields of piezotronics and piezoelectric energy harvesting. ZnO nanomaterials have proven to be the most popular materials in those devices as they possess high piezoelectric coefficients, high surface sensitivity, and low resistivity due to the high native n-type doping and low hole concentration. ZnO nanowires grown by vapor phase techniques with the aid of a metal catalyst provide a ready-made epitaxial Schottky contact free from interfacial layers and major defects. We show here with the most comprehensive experimental investigation to-date of Au nanocontacts to ZnO nanowires that the modulation of bulk and surface oxygen can dramatically increase the rectifying quality of these contacts when applied in the metal-semiconductor-metal (M-S-M) device configuration with potential barriers approaching the performance of planar contacts on single crystal ZnO. Before modification, the Au-ZnO nanowire contacts in a rectifying-nanowire-ohmic M-S-M device configuration typically show limited current rectification and electrical transport properties dominated by surface effects and tunneling at the contact edge. Interestingly, the oxygen modulation only has a minor effect on the resistivity as the high-resolution cathodoluminescence spectroscopy shows that the dominant donors are In, Ga, and Al with no visible band emissions often associated with detrimental point defects. The spectroscopy also revealed that carbon is incorporated into the bulk that may present interesting magnetic properties for future spintronics applications. Atomic-resolution electron microscopy confirms the Zn-polar orientation of the high-quality single crystal nanowires used for the electrical measurements. X-ray photoelectron spectroscopy shows oxygen-annealed nanowires have fewer surface oxygen defects, and when that difference is coupled with a reduction in surface oxygen vacancies via oxygen plasma treatment, the current rectification can increase by several orders of magnitude with a much lower dispersion in the effective potential barrier properties when compared to those that are not annealed. This study concludes after the electrical measurements of 66 nanowire contacts/M-S-M structures with diameters as small as 25 nm using a scanning tunneling microscopy probe that effective device potential barrier heights of 0.65 eV and on-off ratios of 3 orders of magnitude can be achieved. Interestingly, this change in contact properties is transient in nature, revealing dynamic surface effects can govern the rectifying behavior and surface passivation techniques are desirable to achieve consistent performance. This work shows the overriding effects of surface defects and adsorbates on the sloping facets near the Au contact edge and the potential for this effect to be used to control the electrical transport properties and produce molecular-scale sensors to greatly enhance the performance of many piezotronic and energy harvesting devices.
几十年来,肖特基二极管一直是电路的基本元件,时至今日,人们仍在对含有越来越奇特化合物的平面材料进行深入研究。随着纳米技术的诞生,发生了范式转变,事实证明肖特基接触对于实现纳米器件发明并将其性能提高多个数量级至关重要,尤其是在压电器件和压电能量收集领域。氧化锌纳米材料已被证明是这些器件中最受欢迎的材料,因为它们具有高压电系数、高表面灵敏度以及由于高本征n型掺杂和低空穴浓度而具有的低电阻率。借助金属催化剂通过气相技术生长的氧化锌纳米线提供了一种现成的外延肖特基接触,没有界面层和主要缺陷。我们在此展示了迄今为止对金纳米接触氧化锌纳米线最全面的实验研究,结果表明,当应用于势垒接近单晶氧化锌上平面接触性能的金属 - 半导体 - 金属(M - S - M)器件配置时,体相和表面氧的调制可以显著提高这些接触的整流质量。在改性之前,处于整流 - 纳米线 - 欧姆M - S - M器件配置中的金 - 氧化锌纳米线接触通常显示出有限的电流整流,并且电输运特性主要由表面效应和接触边缘的隧穿主导。有趣的是,氧调制对电阻率的影响较小,因为高分辨率阴极发光光谱表明主要施主是铟、镓和铝,没有通常与有害点缺陷相关的可见带发射。光谱还揭示碳被掺入体相中,这可能为未来的自旋电子学应用呈现有趣的磁性。原子分辨率电子显微镜证实了用于电学测量的高质量单晶纳米线的锌极取向。X射线光电子能谱表明经氧退火的纳米线表面氧缺陷较少,并且当这种差异与通过氧等离子体处理减少表面氧空位相结合时,与未退火的相比,电流整流可以提高几个数量级,有效势垒特性的分散性更低。在使用扫描隧道显微镜探针对66个直径小至25nm的纳米线接触/M - S - M结构进行电学测量后,本研究得出结论,有效器件势垒高度可达0.65eV,开/关比可达3个数量级。有趣的是,这种接触特性的变化本质上是瞬态的,表明动态表面效应可以控制整流行为,并且需要表面钝化技术来实现一致的性能。这项工作展示了表面缺陷和吸附物对金接触边缘附近倾斜面的首要影响,以及利用这种效应控制电输运特性并制造分子尺度传感器以极大提高许多压电器件和能量收集器件性能的潜力。