Zemlin F, Reuber E, Beckmann E, Zeitler E, Dorset D L
Science. 1985 Aug 2;229(4712):461-2. doi: 10.1126/science.4012326.
A liquid helium-cooled cryoelectron microscope, operated to expose the specimen to only a very low electron dose, was used to obtain structural images of monolamellar n-tetratetracontane (n-C44H90) crystals at 0.25-nanometer resolution. These results are in contrast to earlier predictions that such extremely beam-sensitive materials could not be studied directly at this level of detail. Analysis of the resultant lattice images gives direct evidence for crystal bending as well as direct visualization of edge dislocations in this material.
一台液氦冷却的低温电子显微镜，在仅向样品施加非常低的电子剂量的条件下运行，用于获得单层正四十四烷（n-C44H90）晶体在0.25纳米分辨率下的结构图像。这些结果与早期的预测相反，早期预测认为这种对电子束极其敏感的材料无法在如此详细的水平上进行直接研究。对所得晶格图像的分析为晶体弯曲提供了直接证据，同时也直接观察到了该材料中的位错。
