Liu Shuo, Liu Chunmeng, Wang Ye, Zhang Jiaqi, Cheng Shaobo, Shan Chongxin
Henan Key Laboratory of Diamond Optoelectronic Materials and Devices, Key Laboratory of Materials Physics, Ministry of Education, School of Physics, Zhengzhou University, Zhengzhou 450052, China.
Center of Advanced Analysis and Gene Sequencing, Zhengzhou University, Zhengzhou 450001, China.
Nanomaterials (Basel). 2025 Mar 11;15(6):428. doi: 10.3390/nano15060428.
Nanowires (NWs), particularly Au NWs, have garnered significant attention for their exceptional properties and applications as nanoscale interconnects in micro-nano electronics. Nevertheless, the stable structure of sub-2nm Au NWs continues to be ambiguous due to the significant challenges in both the fabrication processes and direct atomic-scale structural characterization. This study employs in situ transmission electron microscopy (TEM) techniques combined with the Perdew-Burke-Ernzerhof (PBE) functional within density functional theory (DFT) to systematically investigate the intrinsic relationship between the atomic structure and stability of oriented Au NWs. Our results indicate that the structural stability of Au NWs is influenced by both their structural symmetry and the proportion of (111) surfaces. Additionally, the Young's modulus of Au NWs is related to their cross-sectional symmetry, with an inverse correlation observed when the equivalent radius is below 6 Å. Finally, the number of conductive channels in Au NWs increases with cross-sectional size, with higher symmetry exhibiting more conducting channels. The experimental results offer significant insights into the key determinants influencing the structural integrity of ultrathin gold nanowires, which serves as a crucial basis for their implementation in next-generation nanoscale device technologies.
纳米线(NWs),特别是金纳米线,因其卓越的性能以及在微纳电子学中作为纳米级互连的应用而备受关注。然而,由于制造工艺和直接原子尺度结构表征方面的重大挑战,亚2纳米金纳米线的稳定结构仍然不明确。本研究采用原位透射电子显微镜(TEM)技术,并结合密度泛函理论(DFT)中的佩德韦-伯克-恩泽霍夫(PBE)泛函,系统地研究了取向金纳米线的原子结构与稳定性之间的内在关系。我们的结果表明,金纳米线的结构稳定性受其结构对称性和(111)面比例的影响。此外,金纳米线的杨氏模量与其横截面对称性有关,当等效半径低于6 Å时观察到负相关。最后,金纳米线中的导电通道数量随横截面尺寸增加,对称性越高,导电通道越多。实验结果为影响超薄金纳米线结构完整性的关键决定因素提供了重要见解,这是其在下一代纳米级器件技术中应用的关键基础。