Suppr超能文献

用于评估电化学双层模型和零电荷电位的电容测量:重新评估

Capacitance Measurements for Evaluating Electrochemical Double-Layer Models and Potentials of Zero Charge: A Reassessment.

作者信息

Schalenbach Maximilian, Tempel Hermann, Eichel Rüdiger-A

机构信息

Institute of Energy Technologies (IET-1): Fundamental Electrochemistry, Forschungszentrum Jülich, 52425, Jülich, Germany.

Institute of Physical Chemistry, RWTH Aachen University, 52062, Aachen, Germany.

出版信息

Chemphyschem. 2025 Jul 18;26(14):e202401088. doi: 10.1002/cphc.202401088. Epub 2025 May 25.

Abstract

Differential capacitances (DCAPs) derived from electrostatic Gouy-Chapman-type models for electrochemical double layers (DLs) typically show valley-, bell-, or camel-type profiles as a function of the potential, centered around the potential of zero charge. These DCAP profiles are routinely evaluated with measured potential dependencies of capacitances. Here, the influences of hydrogen evolution, oxygen reduction, and oxide formation on the potential dependence of the capacitance of a polished gold electrode are experimentally examined. These parasitic reactions are found to cause most of the potential-dependent capacitance features that are typically attributed to intrinsic DL properties. With these insights, the historical development of the literature regarding the development of the theoretical framework in relation to capacitance measurements is critically reevaluated. As a result, drawbacks of the 100-year-old Gouy-Chapman theory for the DL are identified. Moreover, DCAPs as differences of electrostatic states are discussed as unable to portray measured capacitances that result from capacitive-resistive and dynamic charge displacements in the DL. Hence, the links between theories and experiments are critically assessed, motivating the need for more advanced atomistic models to adequately portray the DL.

摘要

源自用于电化学双层(DLs)的静电古依-查普曼型模型的微分电容(DCAPs)通常显示出作为电位函数的谷型、钟型或驼峰型曲线,以零电荷电位为中心。这些DCAP曲线通常通过测量的电容电位依赖性来评估。在此,通过实验研究了析氢、氧还原和氧化物形成对抛光金电极电容电位依赖性的影响。发现这些寄生反应会导致大多数通常归因于固有DL特性的电位依赖性电容特征。基于这些见解,对有关电容测量理论框架发展的文献历史发展进行了批判性重新评估。结果,确定了有百年历史的DL古依-查普曼理论的缺点。此外,作为静电状态差异的DCAPs被认为无法描绘由DL中的电容性电阻和动态电荷位移产生的测量电容。因此,对理论与实验之间的联系进行了批判性评估,这激发了对更先进的原子模型来充分描绘DL的需求。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/cd21/12276039/153f3c84f46d/CPHC-26-e202401088-g002.jpg

文献AI研究员

20分钟写一篇综述,助力文献阅读效率提升50倍。

立即体验

用中文搜PubMed

大模型驱动的PubMed中文搜索引擎

马上搜索

文档翻译

学术文献翻译模型,支持多种主流文档格式。

立即体验