Analysis of noise characteristics in intraoral X-ray sensors using the Noise-Power Spectrum and non-parametric metrics from diagnostic imaging.

Digital X-ray sensors have significantly changed dental radiography, enabling faster image acquisition and reducing radiation doses for patients. Despite the advancements in technology, noise in X-ray imaging remains a challenge. In this study, noise was examined using the Noise-Power Spectrum (NPS) and a non-parametric method. Blank images were taken under different exposure times and voltage settings. The analyses show that noise decreases with longer exposure times. Among the examined sensors, 2 showed distinct NPS peaks, and 1 exhibited no relationship between exposure time and noise levels. These results are discussed on terms of specific sensor structures, artefacts and/or unaccessible post-processing algorithms.