Tanaka Nobukazu, Yoon Yongsu
Department of Health Sciences, Faculty of Medical Sciences, Kyushu University, 3-1-1 Maidashi, Higashi-ku, Fukuoka, 812-8582, Japan.
Department of Multidisciplinary Radiological Science, The Graduate School of Dongseo University, Busan, Republic of Korea.
Phys Eng Sci Med. 2025 Jun;48(2):857-865. doi: 10.1007/s13246-025-01553-x. Epub 2025 May 28.
In digital radiography (DR) systems, the sensitivity index, also known as the exposure indicator, exhibits unique behavior, depending on the manufacturer. The exposure index (EI) was introduced by the International Electrotechnical Commission to standardize the sensitivity indices of DR systems produced by different manufacturers for general radiography. This EI value is directly proportional to the dose incident on the imaging detector, providing valuable insight into exposure dose levels and radiographic noise. Recently, technological advancements have enabled some DR systems to display the EI value on the console immediately after exposure. This study investigated the characteristics of the displayed EI value and radiographic noise for an indirect flat-panel detector across four X-ray beam qualities based on added aluminum filters: RQA3, 5, 7, and 9. The displayed EI values for all the X-ray beam qualities proportionally increased to the dose incident on the detector. However, the displayed EI values for RQA3 deviated from those for RQA5, 7, and 9 at the same doses incident on the imaging detector. Furthermore, the Wiener spectrum (WS) was used to evaluate radiographic noise. For similar EI values, the WS of RQA3, which had the highest dose incident on the imaging detector, was slightly lower than those of other X-ray beam qualities. Our findings suggest that the relationship between the displayed EI and radiographic noise varies with the X-ray beam quality.
在数字射线照相(DR)系统中,灵敏度指数,也称为曝光指示器,因制造商而异,表现出独特的特性。国际电工委员会引入了曝光指数(EI),以标准化不同制造商生产的用于普通射线照相的DR系统的灵敏度指数。该EI值与入射到成像探测器上的剂量成正比,能提供有关曝光剂量水平和射线照相噪声的有价值信息。最近,技术进步使一些DR系统能够在曝光后立即在控制台上显示EI值。本研究基于添加铝滤过片,研究了间接平板探测器在四种X射线束质(RQA3、5、7和9)下显示的EI值和射线照相噪声的特性。所有X射线束质下显示的EI值均与入射到探测器上的剂量成比例增加。然而,在成像探测器上相同剂量入射时,RQA3显示的EI值与RQA5、7和9的EI值有所偏差。此外,使用维纳谱(WS)来评估射线照相噪声。对于相似的EI值,成像探测器上入射剂量最高的RQA3的WS略低于其他X射线束质的WS。我们的研究结果表明,显示的EI与射线照相噪声之间的关系随X射线束质而变化。