Bolaji Olayiwola A, Markson Favour E, Kwaku Kevin F, Schaller Robert D
Division of Cardiology, Johns Hopkins Hospital, Baltimore, Maryland, USA.
Division of Cardiology, Jefferson Health-Einstein Hospital, Philadelphia, Pennsylvania, USA.
Pacing Clin Electrophysiol. 2025 Aug;48(8):874-885. doi: 10.1111/pace.15210. Epub 2025 Jun 4.
The implantation of cardiac implantable electronic devices (CIEDs) has steadily increased due to an aging population, advancements in diagnostic techniques, and technological improvements. However, the risk of cardiac perforation following lead implantation, though low, remains a critical concern. Understanding the clinical presentations of this complication is essential for effective prevention, recognition, and management. This review explores the prevalence, clinical presentations, risk factors, diagnosis, management strategies, and future perspectives related to cardiac perforation caused by CIED leads.
由于人口老龄化、诊断技术的进步和技术改进，心脏植入式电子设备（CIED）的植入量稳步增加。然而，导线植入后心脏穿孔的风险虽然很低，但仍然是一个关键问题。了解这种并发症的临床表现对于有效预防、识别和管理至关重要。本综述探讨了与CIED导线引起的心脏穿孔相关的患病率、临床表现、危险因素、诊断、管理策略和未来展望。
