Jha Rajveer, Tsujii Naohito, Riss Alexander, Parzer Michael, Bauer Ernst, Baba Takahiro, Mori Takao
Research Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan.
Institute of Solid State Physics, Technische Universität Wien, Vienna, Austria.
Sci Technol Adv Mater. 2025 May 30;26(1):2512705. doi: 10.1080/14686996.2025.2512705. eCollection 2025.
High-performance thermoelectric (TE) materials near room temperature are crucial for cooling and energy harvesting applications. This study reports the outstanding thermoelectric performance of -type Mn-doped FeVAl Heusler alloy thin films, specifically FeVMnAl, prepared using magnetron sputtering. These films were deposited on insulating oxide substrates to eliminate any spurious contributions from the substrate. Large -type Seebeck coefficients (S) have been observed for all films, revealing a maximum power factor of 4.26 mWKm at 300 K. This study revealed thickness-dependent thermoelectric properties, with the highest power factor achieved in the 500 nm film. Films with d = 300 nm and 500 nm exhibit weak ferromagnetism. Hall resistivity measurements evidence an anomalous Hall effect (AHE) for the 300 nm and 500 nm samples. The AHE is strongest for the 500 nm film, consistent with a magnetic enhancement of the Seebeck coefficient and power factor. Additionally, we synthesized Al-rich p-type FeVMnAl thin films at room temperature, 200°C, 400°C, and 600°C. The film deposited at 600°C exhibits an exceptional figure of merit ~0.8 and a power factor of 6.7 mW·K·m at room temperature, which are respectively, 4 times and 1.5 times larger than the best values ever reported for any bulk or thin film -type FeVAl-based material.
室温附近的高性能热电(TE)材料对于冷却和能量收集应用至关重要。本研究报告了采用磁控溅射制备的n型Mn掺杂FeVAl休斯勒合金薄膜,特别是FeVMnAl的优异热电性能。这些薄膜沉积在绝缘氧化物衬底上,以消除衬底的任何杂散贡献。所有薄膜均观察到较大的n型塞贝克系数(S),在300 K时最大功率因数达到4.26 mW/K²m²。本研究揭示了热电性能与厚度有关,500 nm厚的薄膜实现了最高的功率因数。厚度d = 300 nm和500 nm的薄膜表现出弱铁磁性。霍尔电阻率测量证明300 nm和500 nm样品存在反常霍尔效应(AHE)。500 nm厚的薄膜AHE最强,这与塞贝克系数和功率因数的磁增强一致。此外,我们在室温、200°C、400°C和600°C下合成了富Al的p型FeVMnAl薄膜。在600°C沉积的薄膜在室温下具有优异的优值ZT ~0.8和功率因数6.7 mW·K⁻¹·m⁻²,分别比任何块状或薄膜n型FeVAl基材料报道的最佳值大4倍和1.5倍。