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基于透明元件穆勒矩阵的消光比高精度测量技术研究

Research on High-Precision Measurement Technology of the Extinction Ratio Based on the Transparent Element Mueller Matrix.

作者信息

Xu Ruiqi, Hu Mingpeng, Cao Xuedong, Ren Jiahui

机构信息

National Key Laboratory of Optical Field Manipulation Science and Technology, Chinese Academy of Sciences, Chengdu 610209, China.

Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China.

出版信息

Micromachines (Basel). 2025 Jun 30;16(7):781. doi: 10.3390/mi16070781.

DOI:10.3390/mi16070781
PMID:40731689
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC12299545/
Abstract

With the widespread application of optical technology in numerous fields, the polarization performance of transmissive optical components has become increasingly crucial. The extinction ratio, an important indicator for evaluating their polarization characteristics, holds great significance for its precise detection. Aiming at the measurement of the extinction ratio of a transparent component, this study proposes a measurement method for solving the extinction ratio based on measuring the Mueller matrix of the transparent component. The purpose is to analyze the worst position of the extinction ratio of the transmissive component. The extinction ratio of the sample is obtained according to the phase retardation derived from the Stokes vector of the incident light and the Mueller matrix of the optical component, and a theoretical analysis and simulation of this method are carried out. The simulation results verify the feasibility of the theoretical derivation of this method. To further verify the accuracy of the measurement method, experimental verification is conducted. A standard transparent sample with a phase retardation of 13 nm is selected for actual measurement. The data of independent experiments on the transparent sample under different powers are analyzed, and the extinction ratio of the transparent sample is further obtained. When using this method, the relative error is less than 2%, indicating good accuracy.

摘要

随着光学技术在众多领域的广泛应用,透射光学元件的偏振性能变得越来越重要。消光比作为评估其偏振特性的一个重要指标,对其精确检测具有重要意义。针对透明元件消光比的测量,本研究提出了一种基于测量透明元件穆勒矩阵来求解消光比的测量方法。目的是分析透射元件消光比的最差位置。根据入射光的斯托克斯矢量和光学元件的穆勒矩阵导出的相位延迟来获得样品的消光比,并对该方法进行了理论分析和仿真。仿真结果验证了该方法理论推导的可行性。为进一步验证测量方法的准确性,进行了实验验证。选择一个相位延迟为13nm的标准透明样品进行实际测量。分析了透明样品在不同功率下的独立实验数据,进一步得到了透明样品的消光比。使用该方法时,相对误差小于2%,表明具有良好的准确性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/8717254774a8/micromachines-16-00781-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/e05b9e202a16/micromachines-16-00781-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/bf045ea90eca/micromachines-16-00781-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/653bdcf26e4a/micromachines-16-00781-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/1762829b3bcc/micromachines-16-00781-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/8717254774a8/micromachines-16-00781-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/e05b9e202a16/micromachines-16-00781-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/bf045ea90eca/micromachines-16-00781-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/653bdcf26e4a/micromachines-16-00781-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/1762829b3bcc/micromachines-16-00781-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f32b/12299545/8717254774a8/micromachines-16-00781-g005.jpg

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本文引用的文献

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