Martin Richard K, Keyser Christian K, Khanh Nguyen P, Adams Arielle M
Appl Opt. 2025 Jun 20;64(18):E53-E61. doi: 10.1364/AO.554768.
Active imaging systems, such as light detection and ranging (LiDAR), can return detailed electromagnetic characteristics of each pixel within a field of view. This allows for pixel-by-pixel material identification and classification. Our recently proposed LiDAR system measures the diagonal of the Mueller matrix of each pixel in the field of view, and if there are multiple, temporally distinct reflections in a given pixel, the Mueller matrix from each reflection can be measured. This is accomplished using a time-varying polarization state of the transmitted laser and a two-channel polarization analyzer at the detector. This system has been used in recent work to demonstrate accurate estimation of material Mueller matrices. In this work, we extend the receiver processing to use each estimated Mueller matrix to autonomously perform material identification for scene characterization. The end goal of this manuscript is to explore mathematical techniques of characterizing and classifying pixel surfaces using data from a simulated LiDAR system that incorporates real-world Mueller matrix data. We give an overview of the laboratory-measured dataset and discuss features of the dataset salient to the selection and performance of machine learning algorithms. Classification performance assessment is performed via simulations that incorporate the database of laboratory-measured Mueller matrices. This includes waveform generation, environment simulation, feature extraction, and classification. The simulations show that we can achieve up to 70% classification accuracy on 35 individual classes and 84% accuracy when the data are grouped into five super-classes, provided the assumption of a diagonal Mueller matrix is correct. These results show that the proposed method has promise and should be combined with other methods of classification to achieve even better accuracy.
主动成像系统,如光探测与测距(LiDAR),可以返回视场内每个像素的详细电磁特性。这使得能够逐像素地进行材料识别和分类。我们最近提出的LiDAR系统测量视场内每个像素的穆勒矩阵的对角线,如果在给定像素中有多个时间上不同的反射,则可以测量每个反射的穆勒矩阵。这是通过使用发射激光的随时间变化的偏振态和探测器处的双通道偏振分析仪来实现的。该系统已在最近的工作中用于证明对材料穆勒矩阵的准确估计。在这项工作中,我们扩展了接收器处理,以使用每个估计的穆勒矩阵自主地进行材料识别,用于场景表征。本手稿的最终目标是探索使用来自包含真实世界穆勒矩阵数据的模拟LiDAR系统的数据来表征和分类像素表面的数学技术。我们概述了实验室测量的数据集,并讨论了该数据集对机器学习算法的选择和性能有显著影响的特征。分类性能评估是通过结合实验室测量的穆勒矩阵数据库的模拟来进行的。这包括波形生成、环境模拟、特征提取和分类。模拟结果表明,如果穆勒矩阵为对角矩阵的假设正确,我们在35个单独类别上可以实现高达70%的分类准确率,在数据被分组为五个超类别时可以实现84%的准确率。这些结果表明所提出的方法具有前景,应该与其他分类方法相结合以实现更高的准确率。