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ILL6002×Indianhead小扁豆作图群体中抗壳二孢叶枯病的遗传图谱构建

Genetic mapping of Ascochyta blight resistance in an ILL6002 × Indianhead lentil mapping population.

作者信息

Thackwray Em L, Henares Bernadette M, Grime Christina R, Clark Bethany L, Lee Robert C, Kamphuis Lars G

机构信息

Centre for Crop and Disease Management, School of Molecular and Life Sciences, Curtin University, Bentley, Western Australia, Australia.

出版信息

Plant Genome. 2025 Sep;18(3):e70097. doi: 10.1002/tpg2.70097.

Abstract

Ascochyta blight of lentil (Lens culinaris Medik.) is a fungal disease caused by Ascochyta lentis. This study was carried out to identify the location of quantitative trait loci (QTL) associated with resistance from the accession Indianhead, and how these vary between the recently identified pathotypes of A. lentis. We performed QTL mapping using F recombinant inbred lines derived from a cross between the resistant cultivar Indianhead and susceptible accession ILL6002, following evaluation in seedling assays and the field. Phenotyping identified nine QTL across the four different isolates. A major QTL effective against Pathotype 1 isolates was identified on chromosome 2 in both the seedling and field phenotyping, explaining 60.5% and 12.6% of the resistance phenotype, respectively. Additional QTL for resistance associated with Pathotype 1 isolates were identified on chromosomes 3, 5, and 7, explaining between 8.5% and 13.1% of the phenotype. In contrast, QTL associated with resistance to Pathotype 2 isolates were identified on chromosomes 1, 2, 3, and 7, in locations distinct from those associated with Pathotype 1 resistance. These loci explained between 8.8% and 29.6% of the phenotypic variation. Additionally, evaluation of a natural powdery mildew infection revealed a major QTL on chromosome 3, explaining 25% of the resistance phenotype. The markers flanking the loci identified herein will allow for lentil breeding programs to trace the associated resistance in their breeding program pedigree.

摘要

小扁豆(Lens culinaris Medik.)的壳二孢叶枯病是由扁豆壳二孢引起的一种真菌病害。本研究旨在确定来自品种Indianhead的与抗性相关的数量性状位点(QTL)的位置,以及这些位点在最近鉴定的扁豆壳二孢致病型之间如何变化。我们使用从抗性品种Indianhead和感病材料ILL6002杂交产生的F重组自交系进行QTL定位,随后在苗期试验和田间进行评估。表型分析在四种不同分离株中鉴定出9个QTL。在苗期和田间表型分析中均在2号染色体上鉴定到一个对致病型1分离株有效的主要QTL,分别解释了抗性表型的60.5%和12.6%。在3号、5号和7号染色体上鉴定到与致病型1分离株相关的其他抗性QTL,解释了8.5%至13.1%的表型。相比之下,与致病型2分离株抗性相关的QTL在1号、2号、3号和7号染色体上被鉴定到,其位置与致病型1抗性相关的位置不同。这些位点解释了8.8%至29.6%的表型变异。此外,对自然白粉病感染的评估在3号染色体上发现了一个主要QTL,解释了25%的抗性表型。本文鉴定的位点两侧的标记将使小扁豆育种计划能够在其育种计划谱系中追踪相关抗性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c73b/12397902/f67610f840e5/TPG2-18-e70097-g001.jpg

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