Worthington C R, Blaurock A E
Biophys J. 1969 Jul;9(7):970-90. doi: 10.1016/S0006-3495(69)86431-3.
A structure analysis of the low-angle X-ray diffraction data from nerve myelin is described. The low-angle X-ray data are interpreted in terms of an electron density strip model which has five parameters, these refer to the dimensions of the membrane pair and their component electron densities. Three sets of low-angle X-ray data from peripheral nerve swollen in media of different electron densities are analyzed and membrane pair dimensions and component electron densities on an absolute scale are assigned. Membrane pair dimensions are given for a variety of peripheral nerve myelins and central nervous system myelins.
本文描述了对神经髓鞘低角度X射线衍射数据的结构分析。低角度X射线数据是根据一个具有五个参数的电子密度条带模型来解释的，这些参数涉及膜对的尺寸及其组成部分的电子密度。分析了来自在不同电子密度介质中肿胀的周围神经的三组低角度X射线数据，并给出了绝对尺度上的膜对尺寸和组成部分的电子密度。给出了多种周围神经髓鞘和中枢神经系统髓鞘的膜对尺寸。
