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在低分辨率(17埃)下直接测定周围神经髓鞘的层状结构。

Direct determination of the lamellar structure of peripheral nerve myelin at low resolution (17 A).

作者信息

McIntosh T J, Worthington C R

出版信息

Biophys J. 1974 May;14(5):363-86. doi: 10.1016/S0006-3495(74)85922-9.

Abstract

New X-ray diffraction data from normal nerve and nerve swollen in glycerol solutions have been recorded. Direct methods of structure analysis have been used in the interpretation of the X-ray data, and the phases of the first five orders of diffraction of peripheral nerve myelin have been uniquely determined. The direct methods include deconvolution of the autocorrelation function, sampling theorem reconstructions, and Fourier synthesis comparisons. Electron density profiles of normal and swollen nerve myelin at a resolution of 17 A together with an electron density scale in electrons per cubic angstrom are presented.

摘要

已记录了来自正常神经和在甘油溶液中肿胀神经的新X射线衍射数据。在X射线数据的解释中使用了结构分析的直接方法,并且唯一地确定了周围神经髓鞘前五个衍射级的相位。直接方法包括自相关函数的去卷积、采样定理重建和傅里叶合成比较。给出了分辨率为17埃的正常和肿胀神经髓鞘的电子密度分布图以及以每立方埃电子数为单位的电子密度标度。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0661/1334546/01a81d862160/biophysj00330-0037-a.jpg

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