Berriman J, Bryan R K, Freeman R, Leonard K R
Ultramicroscopy. 1984;13(4):351-64. doi: 10.1016/0304-3991(84)90001-9.
A new method is described for specimen thickness determination in transmission electron microscopy. This is carried out by marking specimens with gold particles and analysing the images of a tilt series by computer. The method makes it possible to distinguish populations of particles on different planes and calculate the distance between the planes with statistical variation. We have applied it to carbon films as test objects and compared the results with those obtained by transverse sectioning, STEM mass measurement, optical density and frequency change of a quartz crystal oscillator. We have then used the method for thickness measurement of multilayered protein crystals and thin sectioned cells.
本文描述了一种用于透射电子显微镜中确定样品厚度的新方法。该方法通过用金颗粒标记样品并通过计算机分析倾斜系列图像来实现。该方法能够区分不同平面上的颗粒群体，并计算平面之间的距离以及统计变化。我们已将其应用于碳膜作为测试对象，并将结果与通过横向切片、扫描透射电子显微镜质量测量、光密度和石英晶体振荡器频率变化获得的结果进行了比较。然后，我们将该方法用于多层蛋白质晶体和超薄切片细胞的厚度测量。
